A high-speed serial interface data encoding and decoding method for resisting single event upset and single event transient
A high-speed serial interface, single-event transient technology, applied in the direction of electrical digital data processing, response error generation, redundant code error detection, etc., can solve the problems of error correction time or hardware overhead, small circuit overhead, etc. , to achieve high error correction efficiency, small circuit overhead, and simple implementation process
Active Publication Date: 2019-04-09
NAT UNIV OF DEFENSE TECH
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[0007] The present invention aims at the technical problems of the existing high-speed serial interface data encoding and decoding method against single event flipping and single event transient, and proposes a high-speed serial interface anti-single event flipping and single event transient state. Interface data encoding and decoding method, which can correct the serial data sent by SerDes for multiple consecutive data errors, and only need to correct one bit error, the hardware implementation process is simple, and the circuit overhead is small
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[0025] Such as figure 1 As shown, the high-speed serial interface data encoding and decoding method against single event reversal and single event transient of the present invention includes the encoding and parallel-to-serial conversion steps of the low-speed parallel data sent by the sending end, and the high-speed serial signal received by the receiving end. The serial-to-parallel conversion and decoding steps;
[0026] The encoding and parallel-to-serial conversion of the sent low-speed parallel data by the sending end are as follows:
[0027] The first step is to group the X-bit parallel data sent continuously by beat into groups of N beats, each group is a data bit matrix with N rows and X columns, where X is the data width of the parallel data, and X and N are natural numbers .
[0028] The second step is to encode each column of data in each group of N rows and X columns of data bit matrix to obtain the check code of the column data. The check code of each column of ...
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The technical problem that an existing high-speed serial interface data encoding and decoding method for resisting single event upset and single event transient is large in error correction time or hardware cost is solved. The high-speed serial interface data encoding and decoding method for resisting single event upset and single event transient comprises the steps of encoding and parallel-serialconversion of sent low-speed parallel data by a sending end, and serial-parallel conversion and decoding of received high-speed serial signals by a receiving end. According to the method, the new data formed by splicing the data bits of the multi-beat parallel data are coded respectively, the error data are corrected in the decoding process, the error data can be directly corrected, retransmission is not needed, and the efficiency is high; In the used coding mode, the error correction process is carried out according to columns, even if continuous multi-bit data errors occur, only one error data exists in the error correction process according to the columns, and therefore the decoding method can correct one bit error, and therefore only one bit error needs to be corrected, the hardware implementation process is simple, and the circuit cost is low.
Description
technical field [0001] The invention relates to a high-speed serial interface data encoding and decoding method, in particular to a high-speed serial interface data encoding and decoding method resistant to single-event reversal and single-event transient. Background technique [0002] There are a large number of high-energy particles (protons, electrons, heavy ions, etc.) in space. After the sequential circuits in integrated circuits are bombarded by these high-energy particles, their maintained state may be reversed. This effect is called the single event reversal effect. After the combined circuit in the integrated circuit is bombarded by these high-energy particles, it is possible to generate a transient electrical pulse. This effect is called the single event transient effect. If the state of the sequential circuit is wrongly reversed, or the instantaneous electrical pulse generated by the single event transient effect is wrongly collected by the sequential circuit, it ...
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Login to View More IPC IPC(8): G06F11/10
CPCG06F11/1004
Inventor池雅庆薛妙莹梁斌陈建军郭欣童董进宇
OwnerNAT UNIV OF DEFENSE TECH