Performance testing system and method for storage particle controller and simulation platform

A storage granule and simulation platform technology, which is applied in the direction of faulty hardware testing methods, using configuration testing to detect faulty hardware, instruments, etc., can solve problems such as the inability to achieve comprehensive testing of storage systems, and achieve the effect of improving performance and data reliability

Active Publication Date: 2019-04-26
DERA CO LTD
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Problems solved by technology

In practice, it is also impossible to achieve a comprehensive test of the storage system

Method used

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  • Performance testing system and method for storage particle controller and simulation platform
  • Performance testing system and method for storage particle controller and simulation platform
  • Performance testing system and method for storage particle controller and simulation platform

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Embodiment Construction

[0045]Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0046] Those skilled in the art can understand that, unless otherwise defined, all terms (including technical terms and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which this invention belongs. It should also be understood that terms, such as those defined in commonly used dictionaries, should be understood to have meanings consistent with the meanings in the con...

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Abstract

The invention discloses a performance test system and method for a storage particle controller and a simulation platform. The test method comprises the following steps: receiving a flash memory command sent by a host control center; A flash memory command is adopted to simulate and store a control command sent by the particle controller; the control command is sent to the storage particle simulator so as to operate to-be-operated data in the storage particle simulator, and the storage particle simulator is used for simulating NAND storage characteristics of the Flash storage particles in the designated life cycle to correspondingly process preset original data; And receiving an operation result returned by the storage particle simulator, performing error correction processing on the operation result according to the simulated error correction model of the storage particle controller, and sending the operation result to a host control center so as to determine the performance of the error correction model. The performance test of the storage particle controller can be rapidly and efficiently realized, the characteristic and abnormal scene test can be efficiently and controllably realized, and the performance and data reliability of the storage product are greatly improved.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to a performance testing system, testing method and simulation platform of a memory particle controller. Background technique [0002] Semiconductor storage particles are generally unreliable storage media due to their own principles and characteristics. In the process of reading, writing, and erasing, as the service life and usage environment change, the characteristics of storage particles show many random changes, including access and erasing time, storage information errors, and errors in reading, writing, and erasing. Moreover, the changes in these characteristics will only occur after a long period of use (in years). Different manufacturers and different types of storage particles have different characteristic change curves, error occurrence curves and distributions, which pose a great challenge to the hardware and software implementation of the storage par...

Claims

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Application Information

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IPC IPC(8): G06F11/26G06F11/22
CPCG06F11/2268G06F11/2273G06F11/2289G06F11/261
Inventor 张建涛夏杰旭王嵩孙丽华李云鹏
Owner DERA CO LTD
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