43results about How to "Effective performance testing" patented technology

A semiconductor memory apparatus includes a bit line pair electrically connected to a memory cell and a bit line sense amplifier for detecting and amplifying voltage levels of the bit line pair. The semiconductor memory apparatus is configured to perform a test to determine the occurrence of leakage current by deactivating the bit line sense amplifier and applying a test voltage to the bit line pair when the semiconductor memory apparatus is in test mode.

A socket for the electrical part of the present invention has a socket body to be mounted on a circuit board and to accommodate the electrical part and a contact pin disposed in the socket body, through which the circuit board and the electrical part are electrically connected. The socket body includes an accommodating surface portion to accommodate the electrical part. A height of the accommodating surface portion is an approximately the same height as that of another socket which is disposed next to the socket. And when a plurality of the sockets for the electrical part are disposed adjacently to each other, the electrical part can be mounted over a plurality of accommodating surface portions in such a manner as bridging the accommodating surface portions.

A socket for the electrical part of the present invention has a socket body to be mounted on a circuit board and to accommodate the electrical part and a contact pin disposed in the socket body, through which the circuit board and the electrical part are electrically connected. The socket body comprises an accommodating surface portion to accommodate the electrical part. A height of the accommodating surface portion is an approximately the same height as that of another socket which is disposed next to the socket. And when a plurality of the sockets for the electrical part are disposed adjacently to each other, the electrical part can be mounted over a plurality of accommodating surface portions in such a manner as bridging the accommodating surface portions.

The invention provides an environmental test chamber and a method for obtaining testing environment by using same. The environmental test chamber comprises an inner chamber, an outer chamber and an air treatment system; the inner chamber is nested inside the outer chamber; the air treatment system is selectively connected with one of the inner chamber and the outer chamber; when the air treatmentsystem is selected to be connected with the inner chamber, an air inlet of the air treatment system is connected with an air outlet of the inner chamber, and an air outlet of the air treatment systemis connected with an air inlet of the inner chamber; when the air treatment system is selected to be connected with the outer chamber, the air inlet of the air treatment system is connected with the air outlet of the outer chamber, and the air outlet of the air treatment system is connected with the air inlet of the outer chamber; and the inner chamber comprises a pollution source generating device and a sampling port. The environmental test chamber can well imitate polluted indoor environment and can conduct purification property test on air purifying equipment under uniform test conditions,thus providing conditions for effectively evaluating the purification effects of the air purifying products on pollutants.

The invention provides a device for detecting a light source of an LED (Light-Emitting Diode) lamp tube. The device for detecting the light source of the LED lamp tube, provided by the invention, is used for fixing an LED lamp through fixing pins of the LED lamp, and distances among the pins of LED lamps with different shapes are same, so that the LED lamps with different shapes can be fixed through only fixing the pins of the LED lamps. Thus, an LED lamp clamp module has universality and can be used for fixing various LED lamps such as an LED lamp with a circular lamp cap, an LED lamp with an elliptic lamp cap and an LED lamp with a flat lamp cap. Meanwhile, two ends of a light filtering bar are fixed by a light filtering bar clamping module in the device so that light filtering bars with various shapes can be fixed. In addition, the device is compact in whole structure and small in occupied space. The device can be used for testing all performances of the LED lamp effectively through a hardware module arranged in a bottom box.