Intelligent door lock test circuit and intelligent door lock test device
A technology for smart door locks and test circuits, applied in measuring devices, measuring electricity, measuring electrical variables, etc., can solve problems such as lack of quality testing and performance cannot be guaranteed, and achieve efficient performance testing and improve production quality.
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[0027] The present invention will be further described below in combination with specific embodiments. Among them, the accompanying drawings are only for illustrative purposes, showing only schematic diagrams, rather than actual drawings, and should not be understood as limitations on this patent; for those skilled in the art, some known structures and their descriptions in the accompanying drawings may be omitted. understandable.
[0028] In the description of the present invention, it should be understood that if the orientation or positional relationship indicated by the terms "upper", "lower", "left", "right", "inner" and "outer" are based on the drawings The orientations or positional relationships shown are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed and operated in a specific orientation, so the positional ...
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