CAF test module, test fixture and test assembly

A technology of test modules and test fixtures, which is applied in the direction of electronic circuit testing, components of electrical measuring instruments, and measuring electricity. It can solve the problems of low test efficiency and long time consumption, improve test safety, simplify wire welding, improve The effect of testing efficiency

Inactive Publication Date: 2020-06-09
CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the traditional CAF test takes a long time and the test efficiency is low

Method used

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  • CAF test module, test fixture and test assembly
  • CAF test module, test fixture and test assembly
  • CAF test module, test fixture and test assembly

Examples

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Embodiment Construction

[0031] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.

[0032]It should be noted that when an element is referred to as being “fixed” to another element, it can be directly on the other element or there can also be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected t...

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Abstract

The invention relates to a CAF test module, a test fixture and a test assembly. The CAF test module comprises a test substrate and a plug pad. The test substrate is provided with a test hole chain group; the test hole chain group comprises a first plated through hole, a first wire, a second plated through hole and a second wire, the first plated through hole is electrically connected with the first wire to form a first test hole chain, and the second plated through hole is electrically connected with the second wire to form a second test hole chain. The plug pad is arranged on one side of thetest substrate, the plug pad comprises at least two plugs, the first test hole chain is electrically connected with one plug through the first wire, and the second test hole chain is electrically connected with the other plug through the second wire. During a test, the plug pad is inserted into a slot of the connector, and after test bias voltage is applied to the test hole chain group, the CAF resistance of the test hole chain group can be judged by monitoring the resistance value of the test hole chain group. And after the test is finished, the plug pad is pulled out from the slot of the connector such that the test time can be shortened, and the test efficiency can be improved.

Description

technical field [0001] The invention relates to the technical field of testing electronic components, in particular to a CAF test module, a test fixture and a test assembly. Background technique [0002] CAF, also known as conductive anode filament, means that the printed circuit board is applied with a DC voltage and placed in a high-humidity environment. The copper metal at the high anode is oxidized into copper ions and migrates and grows along the glass fiber to the cathode, eventually leading to printing The circuit board is poorly insulated or even short-circuited. Common CAF failures occur between holes and holes, holes and lines, and lines and lines of printed circuit boards. CAF failures will affect the insulation performance of printed circuit boards during their life cycle. The traditional test method is to manually solder the wire to the metallized hole of the test sample, and clean the residual flux, and judge its resistance to CAF by applying a test bias and m...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/04
CPCG01R31/2806G01R31/2817G01R31/2812G01R1/0408
Inventor 周波沈江华何骁贺光辉邹雅冰杨颖李星星
Owner CHINA ELECTRONICS PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST
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