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A double bending machine for probes

A technology of bending machine and bending mechanism, applied in the direction of needle, knitting, application, etc., can solve the problems of low efficiency and high defective rate

Active Publication Date: 2021-07-06
渭南木王智能科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a double bending machine for probes to solve the problems of low efficiency and high defective rate when bending probes manually.

Method used

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  • A double bending machine for probes
  • A double bending machine for probes
  • A double bending machine for probes

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Experimental program
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Effect test

Embodiment Construction

[0030] The implementation of the present invention will be described in detail below with examples, so as to fully understand and implement the implementation process of how the present invention uses technical means to solve technical problems and achieve technical effects.

[0031] Such as figure 1 As shown, a double bending machine for a probe of the present invention includes:

[0032] a clamping mechanism in which the probe is fastened;

[0033] a bending mechanism, the bending mechanism is located outside the clamping mechanism, and is used for the first bending of the probe;

[0034] a second bending mechanism, the second bending mechanism is located outside the clamping mechanism, and is used for the second bending of the probe;

[0035] A sliding mechanism, the clamping mechanism is arranged on the sliding mechanism, and can move toward the first bending mechanism and the second bending mechanism along with the sliding mechanism.

[0036] Using a double bending mac...

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Abstract

The invention discloses a double-bending machine for a probe, which includes a clamping mechanism in which the probe is fastened; a bending mechanism, and the bending mechanism is located outside the clamping mechanism , used for the first bending of the probe; the second bending mechanism, the second bending mechanism is located outside the clamping mechanism, used for the second bending of the probe; the sliding mechanism, the The clamping mechanism is arranged on the sliding mechanism and can move toward the first bending mechanism and the second bending mechanism along with the sliding mechanism. The double bending machine used for the probe solves the problems of low efficiency and high defective rate when the probe is bent manually in the prior art.

Description

technical field [0001] The invention belongs to the technical field of precision hardware processing equipment, in particular to a double bending machine for probes. Background technique [0002] Precision metal processing, that is, using lathes, milling machines, drilling machines, polishing and other mechanical equipment to process raw materials (stainless steel, copper, aluminum, iron, etc.) into various high-precision parts according to customer drawings or sample requirements . [0003] The probe is a high-end electronic precision hardware component, which is mainly used as a contact medium for electrical testing. It has been widely used in aviation, aerospace, military industry, medical treatment, optoelectronics and other fields. In the production process of the probe, it mainly involves blind hole drilling, micro hole drilling, slotting and bending processing. For the bending process of the probe, due to the small size of the probe, it is difficult to use tradition...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B21G1/00B21F1/00
CPCB21F1/00B21G1/003
Inventor 张明海付盼红
Owner 渭南木王智能科技股份有限公司