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One-way bending equipment for probe

A bending and one-way technology, applied in the field of one-way bending equipment for probes, can solve the problems of difficult control of bending angle and low work efficiency

Pending Publication Date: 2021-09-10
渭南木王智能科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a one-way bending device for probes, which solves the problems of low work efficiency and difficulty in controlling the bending angle when bending the probing probes in the existing manual way

Method used

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  • One-way bending equipment for probe
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  • One-way bending equipment for probe

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Embodiment Construction

[0017] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention.

[0018] In the description of the present invention, if the first and the second are described only for the purpose of distinguishing technical features, it cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features or implicitly indicating The sequence of the indicated technical features.

[0019] In the description of the present invention, unless otherwise clearly defined, words such as setting, installation, and connection should be understood in a broad sense...

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Abstract

The invention discloses one-way bending equipment for a probe. The one-way bending equipment for the probe comprises a base, a first driving mechanism and two supporting plates are arranged on the base, a workbench is arranged at the upper ends of the two supporting plates, the first driving mechanism is located between the two supporting plates, a rotating shaft is arranged at the driving end of the first driving mechanism. The upper end of the rotating shaft extends out of the workbench, and a bending block is arranged at the upper end of the rotating shaft; a clamp and a second driving mechanism are arranged on the workbench, a clamping groove is formed in the clamp, an ejector block is arranged at the driving end of the second driving mechanism and located beside the clamp, and the bending block is located on the front side of the clamping groove. According to the one-way bending equipment for the probe, the problems that the working efficiency is low and a bending angle is difficult to control when the probe is bent in an existing manual mode are solved.

Description

technical field [0001] The invention belongs to the technical field of probe processing equipment, and in particular relates to one-way bending equipment for probes. Background technique [0002] The test probe, also known as a semiconductor probe, is composed of a needle tube, a spring and a needle head, wherein the spring is installed in the needle tube, and the needle head is assembled at both ends of the needle tube. After the test probe is assembled, sometimes based on the application requirements of special occasions, it is necessary to bend the test probe to a certain extent. [0003] However, at present, the bending process of the test probe is mainly carried out by people pressing the test probe with the help of a bending block to rotate. This operation method generally has low production efficiency and is difficult to adapt to large-scale production and processing operations. The main test is to control the rotation angle of the bending block based on experience. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B21F1/00
CPCB21F1/004
Inventor 张飞龙付盼红申啸张明海
Owner 渭南木王智能科技股份有限公司