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Applicable to the automatic and fast debugging method of the magnetic field of surface-mounted circulators with lumped parameters

A technology of lumped parameters and debugging methods, applied in the direction of waveguide-type devices, circuits, electrical components, etc., can solve the problems of unfavorable device quality control and optimization, devices can not reach the best state, heavy workload, etc. Performance status analysis and quality control and optimization, eliminate device consistency problems, and improve efficiency

Active Publication Date: 2020-11-24
中国电子科技集团公司第九研究所
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] (1) Due to the need to repeatedly operate the charging and demagnetizing equipment, the workload is heavy, the operation is complicated, and the efficiency is low;
[0004] (2) Due to human factors, different people have certain differences in the judgment of the final result, the device cannot reach the best state, and the consistency is poor;
[0005] (3) During the magnetic field debugging process, manual debugging basically does not record the corresponding performance data for each device, which is not conducive to device quality control and optimization

Method used

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  • Applicable to the automatic and fast debugging method of the magnetic field of surface-mounted circulators with lumped parameters
  • Applicable to the automatic and fast debugging method of the magnetic field of surface-mounted circulators with lumped parameters
  • Applicable to the automatic and fast debugging method of the magnetic field of surface-mounted circulators with lumped parameters

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] Embodiment 1: see figure 1 and figure 2 , an automatic and rapid debugging method suitable for the magnetic field of a surface-mounted circulator with lumped parameters, comprising the following steps:

[0042] (1) Build a control system for debugging the device to be debugged. The device to be debugged is a lumped parameter surface mount circulator. The control system includes a computer, a network analyzer, a mechanical arm, a charging and demagnetizing machine, a debugging fixture, And three placement positions, in which the network analyzer, the manipulator and the charging and demagnetizing machine are all connected to the computer;

[0043] The network analyzer is used to obtain the S parameter data of the device to be debugged and send it to the computer;

[0044] The mechanical arm is used to move the device to be debugged according to the control of the computer;

[0045] The charging and demagnetizing machine is used to generate different charging and dema...

Embodiment 2

[0061] Example 2: see figure 1 , this embodiment is further improved on the basis of Embodiment 1. After the step (4) obtains the S parameter data of the initial state of the device to be debugged, it also includes: judging whether the device to be debugged is connected to the debugging fixture normally according to the S parameter data , if it is not normal, reinstall the device to be debugged after manual inspection, and reacquire the S parameter data of the initial state until the connection is normal.

[0062] It also includes step (7) judging whether the control system needs to be shut down;

[0063] If shutdown is required, the charging and demagnetizing machine is reset to the initial voltage, the mechanical arm is controlled to a safe position, and the power is turned off;

[0064] If the system does not need to be shut down, repeat steps (4)-(6) to debug the next device to be debugged.

[0065] In the present invention, for the judgment of whether the performance in...

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Abstract

The invention discloses a method suitable for automatic and quick debugging of the magnetic field of a surface-mounted circulator with lumped parameters, including (1) building a control system for debugging devices to be debugged, including a computer, a network analyzer connected to the computer, and a mechanical arm , a charging and demagnetizing machine, a debugging fixture, and three placement positions, the placement positions respectively correspond to the device disk to be debugged, the qualified device disk and the unqualified device disk; (2) control system startup detection; (3) control system reset, set The charging and demagnetizing machine is set to the demagnetization mode, and the mechanical arm is reset to the position of the device to be debugged; (4) Control the mechanical arm to take out a device to be debugged, install it on the debugging fixture, and obtain the S parameter data of the device to be debugged through the network analyzer; ( 5) Control the charging and demagnetizing machine to automatically adjust the voltage to adjust the magnetic field of the product; (6) Judge whether the product is qualified; (7) Sorting. The invention can realize the automatic debugging of the magnetic field of the device, greatly improves the efficiency, and makes the production more efficient and stable.

Description

technical field [0001] The invention relates to a debugging method, in particular to an automatic and fast debugging method suitable for the magnetic field of a surface-mounted circulator with lumped parameters. Background technique [0002] Microwave passive devices such as lumped parameter surface-mount circulators require magnetic field debugging to achieve the best performance. At present, the magnetic field debugging of the surface-mounted circulator with lumped parameters is basically carried out by manual charging and demagnetization, which has a large workload and low efficiency. performance at its best. And the artificial magnetic field debugging has the following deficiencies: [0003] (1) Due to the need to repeatedly operate the charging and demagnetizing equipment, the workload is heavy, the operation is complicated, and the efficiency is low; [0004] (2) Due to human factors, different people have certain differences in the judgment of the final result, the...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01P1/38H01P11/00
CPCH01P1/38H01P11/00
Inventor 周永川吴江刘有彬闫欢胡艺缤白雪
Owner 中国电子科技集团公司第九研究所
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