An anti-interference method and system for space neutral atomic composition analysis instrument

Abstract

The invention discloses an anti-interference method and system for a space neutral atomic composition analysis instrument. The space neutral atomic composition analysis instrument includes a time-of-flight measurement module and an MCP detector. The method includes: receiving the space neutral Particles to be measured for atomic composition analysis instruments; based on the time-of-flight threshold limit, high-energy charged particles are screened out from the particles to be tested; based on the MCP pulse height threshold limit, single ultraviolet photons or single extreme ultraviolet photons are screened out from the particles to be tested; based on According to the position correspondence relationship of the secondary electrons and the constraints of the time of flight, a plurality of simultaneously entering ultraviolet photons and / or extreme ultraviolet photons are screened out from the particles to be measured; thus the neutral atoms to be measured are obtained. By adopting the method of the invention, the space neutral atom component analysis instrument can measure the neutral atom event under the condition that the space neutral atom flux is small and the interference source flux is large.

Description

technical field [0001] The invention relates to the field of space detection technology, in particular to a neutral atom imaging device with an energy range of hundreds of eV to hundreds of KeV and an instrument for neutral atom composition analysis with a time-of-flight measurement structure, in particular to a space An anti-interference method and system for a neutral atomic composition analysis instrument. Background technique [0002] The neutral atomic composition analysis instrument includes a time-of-flight measurement module and an MCP detector. The time-of-flight measurement module is used to measure the time-of-flight of particles; MCP is an electron multiplication device with two-dimensional position resolution capability, by using the MCP detector to measure the secondary electrons of neutral atoms passing through the carbon film, and time it position. But the other two kinds of main particles in space: charged particles and ultraviolet and extreme ultraviolet ...

AI Technical Summary

Problems solved by technology

But the other two kinds of main particles in space: charged particles and ultraviolet and extreme ultraviolet photons will also be captured by MCP detectors, and the signals generated by these background sources will be considered by the system as secondary electrons, which will cause the instrument to misanalyze sexual atomic component

At present, a deflection plate is added at the entrance, and a high voltage is applied to the deflection plate to deflect the charged particles, so that it cannot be injected into the instrument along a straight line to eliminate the influence of the charged particles. However, this voltage has an upper limit, which exceeds the maximum energy deflected by the voltage. Charged particles are shot into the interior of the instrument

[0003] The current neutral atomic composition analysis instruments all add a transmission grating at the entrance of the carbon film or increase the thickness of the carbon film to filter the influence of ultraviolet photons, but a thicker carbon film will also hinder low-energy neutral atoms. This narrows the detection energy range of the instrument and increases the angular scattering of the particles

Transmission gratings can affect instrument sensitivity, affecting time resolution and signal-to-noise ratio

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