Device for testing water vapor transmittance of ultrahigh-barrier film
A technology of water vapor transmission rate and testing device, which is applied in the direction of measuring device, permeability/surface area analysis, suspension and porous material analysis, etc., to achieve the effect of improving device integration, improving utilization rate, and stable and accurate measurement results
Pending Publication Date: 2021-03-09
赣州优膜科技有限公司
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Problems solved by technology
However, this test method still has certain deficiencies in terms of device integration, electrical signal measurement error, and bending measurement.
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[0026] The specific implementation case of the present invention will be described in detail below in conjunction with accompanying drawing:
[0027] like figure 1 As shown, a water vapor transmission rate testing device for an ultra-high barrier film includes: an inert gas chamber 1, a sealable transfer door 2, a constant temperature and humidity chamber 3, a test substrate 4, a conductive fixture 5, a control board 6, and a digital Source meter 7 and host computer 8, further, the inert gas chamber 1 is connected to the constant temperature and humidity chamber 3, and the sealable transfer door 2 is arranged between the inert gas chamber 1 and the constant temperature and humidity chamber 3 At the junction, the test substrate 4 prepared in the inert gas chamber 1 can be transferred to the constant temperature and humidity chamber 3 through the airtight transfer door 2 for testing. After the test substrate 4 is connected to the control board 6 through the conductive fixture 5,...
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The invention discloses a device for testing the water vapor transmittance of an ultrahigh-barrier film. The device comprises an inert gas chamber, a sealable transfer door, a constant-temperature constant-humidity chamber, a test substrate, a conductive clamp, a control panel and a digital source meter. The inert gas chamber is connected with the constant-temperature constant-humidity chamber, the sealable transfer door is arranged at the joint of the inert gas chamber and the constant-temperature and constant-humidity chamber, the test substrate comprises a flexible substrate, metal electrode patterns, a calcium film, a to-be-tested film and sealant, the metal electrode patterns are four long-strip probes which are arranged in parallel at equal intervals, and the control panel and the digital source meter are connected through the conductive clamp and a wire. The device has the advantages that the integrated testing device for measuring the water vapor transmittance by using the calcium film oxidation method is provided; the conductivity of the calcium film is measured by adopting an equidistant four-probe method, so that the result is more stable and accurate; and the test requirements of multi-sample measurement, water vapor transmittance of the flexible film in a bending state and the like can be met.
Description
technical field [0001] The invention relates to the field of test devices, in particular to a test device for detecting the water vapor transmission rate of an ultra-high barrier film Background technique [0002] For electronic devices such as quantum dot light-emitting diodes (QLEDs), organic light-emitting diodes (OLEDs) and solar cells, a large number of water and oxygen sensitive elements inside them are very vulnerable to failure due to infiltration of water vapor, so good and reliable packaging technology can greatly improve Improve device performance and service life. [0003] At present, the water vapor transmission rate (WVTR) is generally used as the main basis for evaluating the barrier performance of ultra-high barrier films. In addition, with the development trend of flexible electronic devices, the water vapor barrier ability of ultra-high barrier films in the bent state has also attracted special attention. Among various WVTR test methods, the method of usi...
Claims
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Login to View More IPC IPC(8): G01N15/08
CPCG01N15/0806
Inventor 徐从康
Owner 赣州优膜科技有限公司