Supercharge Your Innovation With Domain-Expert AI Agents!

Failure analysis method, computer equipment and storage medium

A failure analysis and failure data technology, applied in the storage field, can solve the problems of limiting analysis speed and efficiency, consuming a lot of time and labor costs, and achieve the effect of fast and effective automatic judgment

Active Publication Date: 2021-05-14
CHANGXIN MEMORY TECH INC
View PDF5 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The determination of the storage failure type of each chip particle in the storage system is usually done manually, so it consumes a lot of time and labor costs, limiting the analysis speed and efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Failure analysis method, computer equipment and storage medium
  • Failure analysis method, computer equipment and storage medium
  • Failure analysis method, computer equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0084] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the application are given in the drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of this application more thorough and comprehensive.

[0085] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terms used herein in the specification of the application are only for the purpose of describing specific embodiments, and are not intended to limit the application.

[0086] It can be understood that the terms "first", "second", etc. used in this application may be used t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a failure analysis method, computer equipment and a storage medium. The failure analysis method comprises the steps: acquiring the failure data of IO channels in a target chip particles, wherein the target chip particle comprises m physical modules, each physical module comprises a plurality of IO channels, and m is a positive integer larger than or equal to 2; splitting the failure data to form m groups of module failure data corresponding to each physical module; judging the local failure type of each physical module according to the failure data of each module; and determining the storage failure type of the target chip particle according to the local failure type of each physical module. The failure analysis efficiency can be effectively improved.

Description

technical field [0001] The present application relates to the field of storage technology, in particular to a failure analysis method, computer equipment and storage media. Background technique [0002] Storage system is one of the important components of computer. The storage system provides the ability to write and read information (programs and data) required for computer work, and realizes the information memory function of the computer. [0003] The determination of the storage failure type of each chip particle in the storage system is usually carried out manually, so it consumes a lot of time and labor costs, and limits the analysis speed and efficiency. Contents of the invention [0004] Based on this, it is necessary to provide a failure analysis method, a computer device and a storage medium capable of improving the efficiency of failure analysis for the above technical problems. [0005] A failure analysis method comprising: [0006] Obtain failure data of ea...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G11C29/56
CPCG11C29/56008G11C29/4401G11C2029/4402G11C29/56004G06F11/1666
Inventor 杨志张利霞何浩
Owner CHANGXIN MEMORY TECH INC
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com