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High radiation dose measurement method and system

A dose measurement and high radiation technology, which is applied in the field of high radiation dose measurement methods and systems, can solve the problems of long dose data acquisition time, complicated data acquisition steps, inaccurate reading of dose values, etc.

Active Publication Date: 2021-06-11
SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI
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  • Abstract
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Problems solved by technology

[0005] For this reason, the technical problem to be solved by the present invention is to overcome the problems of long dose data acquisition time, complicated data acquisition steps and inaccurate reading of dose values ​​in the radiation dosimetry method in the prior art.

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  • High radiation dose measurement method and system
  • High radiation dose measurement method and system
  • High radiation dose measurement method and system

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Embodiment Construction

[0047] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, so that those skilled in the art can better understand the present invention and implement it, but the examples given are not intended to limit the present invention.

[0048]The Th-SINAP series crystal materials mentioned in the present invention will produce radiation photofluorescence changes after being irradiated by ultraviolet rays, X-rays, gamma rays, and beta rays, and the irradiated crystal materials will produce obvious and visible fluorescence under the excitation of ultraviolet rays , the color of the fluorescence will change with the dose absorbed by the crystal material, and the green component in the fluorescence will be significantly enhanced with the increase of the absorbed dose, and the fluorescence component is linearly related to the absorbed dose. Therefore, an embodiment of the present invention provides a high radiation dos...

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Abstract

The invention relates to a high radiation dose measurement method and system, and the method comprises the steps: collecting visible fluorescence data generated by a Th-SINAP crystal dose sheet under excitation of ultraviolet after a reading instruction is received; screening and removing the part which is influenced by using ultraviolet as an excitation light source in the visible fluorescence data to obtain actual visible fluorescence data; and according to the actual visible fluorescence data, reading a corresponding dose value on the relation curve of the visible fluorescence data and the dose determined by the calibration experiment, and calculating the real-time dose rate. According to the method, ultraviolet is utilized to excite fluorescence, the radiation dose is measured by collecting the color of the fluorescence, and the part, which is influenced by utilizing the ultraviolet as an excitation light source, in visible fluorescence data is eliminated; the problems of long dose data acquisition time, complex data acquisition steps and inaccurate dose value reading when the traditional technology is used for measuring the high radiation dose (Gy / h-MGy / h magnitude) are solved.

Description

technical field [0001] The invention relates to the technical field of radiation dose detection, in particular to a high radiation dose measurement method and system. Background technique [0002] The field of nuclear science and technology in my country is developing rapidly. Radioisotopes and related irradiation devices and technologies are widely used in industry, agriculture, medical and health, geological survey and other fields. Monitoring and other application scenarios play a very important role. [0003] At present, the methods for measuring radiation dose mainly include: 1). Use thermoluminescent dose tablets to read out the radiation dose value based on the principle of thermoluminescence; 2). Use the radiation color-changing indicator label to determine the radiation dose value according to the color of the label after irradiation; 3). Use the scintillator to cooperate with the photoelectric conversion device to process the signal through the back-end electronic ...

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Application Information

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IPC IPC(8): G01T1/10G01T7/00
CPCG01T1/10G01T7/005
Inventor 戴志敏侯会良林健陆黄杰黄跃峰王建强钱渊
Owner SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI
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