DC micro-grid fault arc modeling and simulation method and system
A fault arc and DC micro-grid technology, applied in CAD circuit design, special data processing applications, etc., can solve problems such as large differences in simulation results, inability to reflect the influence of experimental parameters on arc characteristics, and difficulty in determining arc model parameters. highly reliable effect
Pending Publication Date: 2021-11-26
SHANGHAI UNIV
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Problems solved by technology
The parameters of the existing arc model are difficult to determine, the simulation results are quite different from the actual experimental results, and the influence of the experimental parameters on the arc characteristics cannot be reflected in the model
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[0056] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0057] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0058] The present invention provides a DC microgrid fault arc modeling and simulation method, such as Figure 10 shown. Include the following steps:
[0059] S100. Build a DC microgrid fault arc test experiment...
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The invention discloses a DC micro-grid fault arc modeling and simulation method and system, and the method comprises the following steps: simulating arc faults generated at different arc lengths and occurrence positions, and collecting the arc current data of branches where the arc faults are located; respectively analyzing and fitting the relationship between the corresponding current drop value and the line current and the arc length when the arc fault occurs, the relationship between the volt-ampere characteristic of the arc current in the time domain range and the generation position and the arc length, and the relationship between the pink noise characteristic of the arc current in the frequency domain range and the generation position and the arc length; and obtaining a time domain fitting relationship and a frequency domain fitting relationship; based on the time domain fitting relationship and the frequency domain fitting relationship, establishing a simulation model of the DC microgrid fault arc; and operating the simulation model, and outputting a simulation result of the DC microgrid fault arc. According to the invention, the arc fault in the direct current micro-grid system is simulated, and the time domain and frequency domain characteristics of the arc current are combined, so that actual arc data are comprehensively and accurately close to the actual arc data.
Description
technical field [0001] The invention relates to the technical field of electrical engineering, in particular to a DC microgrid fault arc modeling and simulation method and system. Background technique [0002] With the rapid development of new energy technology and DC systems, various DC sources, storage, and loads such as photovoltaics, energy storage, and solid-state lighting continue to infiltrate applications, promoting the rapid growth of DC micro-grids represented by buildings, ships, and automobiles. Since DC microgrids can connect renewable energy systems into the distribution grid, researchers are focusing on technologies that can support the widespread application of DC microgrids. However, in the DC microgrid system, the DC fault arc caused by loose cable joints, poor contact, and broken wire insulation is difficult to detect and extinguish, and the high temperature generated will cause a fire, which will affect the safety and reliability of the DC microgrid. It ...
Claims
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CPCG06F30/39
Inventor汪飞缪文超王卓凡
OwnerSHANGHAI UNIV