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Precisive measurement for parameter of chromatography spike and area of overlapped peak

A technique for chromatographic peaks and overlapping peaks, which is used in the field of accurate determination of chromatographic peak shape parameters and overlapping peak areas, and can solve problems such as difficulty in obtaining accurate peak areas of overlapping components.

Inactive Publication Date: 2005-12-28
DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0003] At present, although the recording and processing of chromatographic data has been generally replaced by chromatographic workstations, which provides convenience for the reprocessing and finishing of experimental data, most of the chromatographic workstations still use the data processing method of integrators. The overlapping peaks are integrated by the classic mid-cut method or tangent line, and it is difficult to obtain the accurate peak area of ​​the overlapping components; there is no effective treatment method for overlapping peaks that do not expose shoulder peaks

Method used

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  • Precisive measurement for parameter of chromatography spike and area of overlapped peak
  • Precisive measurement for parameter of chromatography spike and area of overlapped peak
  • Precisive measurement for parameter of chromatography spike and area of overlapped peak

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Embodiment

[0051] 1. Determine the retention time of six volatile organic compounds ethylbenzene, cumene, mesitylene, p-cymene, n-butylbenzene, and naphthalene at 80℃, and analyze the corresponding conditions by chromatographic peak automatic curve fitting method σ, τ parameters, integrate the fitting peak to get the half-width parameter W H / 2 , The parameters are listed in Table 1. σ, τ and W of the six volatile organic compounds at 80℃ H / 2The relationship between parameters and retention time is shown in the attachment figure 2 .

[0052] Compound

tr, mm

σ, sec

τ, sec

W H / 2 , Sec

Ethylbenzene

Cumene

Mesitylene

Paraisopropyl toluene

N-Butylbenzene

Naphthalene

11.783

15.192

18.612

24.847

29.579

62.232

1.33

1.76

2.18

2.98

3.56

7.23

0.72

0.78

0.89

1.24

1.58

4.70

3.44

4.44

5.46

7.48

8.98

19.20

[0053] 2. Automatic analysis of two overlapping...

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Abstract

A method for determining chromatograph peak form parameter and overlapped peak area includes setting time value and chromatographic signal value at point for chromatographic elution curve and peak number, using n as total number for point, using Gauss model as objective function to fit said elution curve to be determined, utilizing nonlinear least square method to solve out optimum parameter and using the corresponding relation of fitting elution curve to elution curve to be determined to work out peak form parameter and overlapped peak area of chromatograph .

Description

Technical areas: [0001] The invention relates to a method for accurately measuring chromatographic peak shape parameters and overlapping peak areas based on chromatographic outflow curves. It can be used for accurate determination of peak shape parameters and areas of two overlapping peaks, three overlapping peaks, four overlapping peaks to ten overlapping peaks. It not only It is suitable for conventional chromatograms generated by gas chromatography, liquid chromatography, supercritical chromatography, ion chromatography, affinity chromatography, capillary electrochromatography, capillary electrophoresis, etc. It is also suitable for mass spectrum totals generated by the combination of various types of chromatography, mass spectrometry, and infrared. Extended chromatograms such as ion chromatogram (TIC), selected ion mass spectrometry chromatogram (SIC), infrared structural chromatogram, etc. Background technique: [0002] Chromatographic techniques are important separatio...

Claims

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Application Information

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IPC IPC(8): G01N30/86
Inventor 薛兴亚梁鑫淼
Owner DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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