Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and apparatus for a downhole refractometer and attenuated reflectance spectrometer

A kind of equipment and refractive index technology, which is applied in the field of measuring refractometry and spectrometry, can solve the problem that the sample cannot be cleared to provide accurate monitoring, etc.

Inactive Publication Date: 2006-09-20
BAKER HUGHES INC
View PDF3 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0015] Processing of crude refractive index readings does not provide accurate monitoring of sample clearing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and apparatus for a downhole refractometer and attenuated reflectance spectrometer
  • Method and apparatus for a downhole refractometer and attenuated reflectance spectrometer
  • Method and apparatus for a downhole refractometer and attenuated reflectance spectrometer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] The present invention provides a method and apparatus for determining a number of formation fluid properties from refractometer measurements. The present invention also provides a method and apparatus for more accurately distinguishing between gases and fluids based on the gas's much lower refractive index. The refractive index of the wellbore or formation fluid can be determined from the fraction R of light reflected from the interface between the preferably transparent window of known refractive index and the formation fluid being analyzed.

[0037] Figure 1 shows a graph 101 of the percentage of light reflected from a fluid / sapphire interface where the light is normally incident on the surface plane of the transparent window and interface. In this figure, the window has a fixed refractive index of 1.75 but the refractive index of the fluid is varied. Minimum reflection occurs when the refractive index of the fluid is equal to that of the window (1.75 for sapphire). ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
viewing angleaaaaaaaaaa
refractive indexaaaaaaaaaa
refractive indexaaaaaaaaaa
Login to View More

Abstract

The invention relates to refractometry and attenuated reflectance spectrometry in a wellbore environment. Specifically, it pertains to a robust apparatus and method for measuring refractive index of fluids along a continuum (rather than in steps), and for measuring attenuated reflectance spectra, and for interpreting the measurements made with this apparatus to determine a variety of formation fluid parameters. The present invention provides a method and apparatus to distinguish between gas and liquid based on the much lower index of refraction of gas. It can also be used to monitor fluid sample clean up over time. The refractive index of a wellbore fluid is determined from the fraction, R, of light reflected off the interface between a transparent window that has a known refractive index and this fluid. Preferably, the refractive index is measured at some wavelength of light for which the fluid is not highly attenuating but is optimally attenuating. The adjacent transmission spectrometer can be used to correct the refractive index measurement for attenuation at those wavelengths, which it monitors. Also, this reflection-based refractometer design can be used as an attenuated reflectance spectrometer at highly attenuating wavelengths.

Description

technical field [0001] The present invention relates to the measurement of refractometry and spectrometry in the drilling environment. In particular, the present invention relates to a robust apparatus and method for measuring the refractive index of a fluid along a continuum (rather than stepwise) and measuring attenuated reflectance spectra, and for interpreting measurements obtained with the apparatus to determine the various parameters. The refractometers and attenuated reflectance spectrometers disclosed herein have a simplified design that makes them well suited to downhole environments. Background technique [0002] Oil and gas companies spend vast amounts of money trying to discover hydrocarbon deposits. They drill exploratory wells in the most promising fields and use these exploratory wells to determine not only whether hydrocarbons are present, but also the nature of the hydrocarbons present. [0003] For deep offshore fields, it must first take several years t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/43E21B49/10E21B47/10G01N1/00G01N21/35G01N21/41G01N21/55
CPCG01N21/3504G01N21/3577G01N21/43E21B47/102G01N21/552G01N21/41G01N21/35E21B47/113G01N27/226
Inventor 洛克·迪弗格奥阿尔诺德·维尔考保罗·伯格恩路易斯·普里兹
Owner BAKER HUGHES INC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com