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Process for producing high-power quick soft-restoring diode

A soft recovery, diode technology, applied in the direction of electrical components, semiconductor/solid-state device manufacturing, circuits, etc., can solve the hard reverse recovery characteristics, difficult to solve the forward voltage drop and reverse recovery characteristics of high-power fast soft recovery diodes and high power, limiting the application of high-power high-frequency devices, etc., to achieve the effect of soft reverse recovery characteristics

Inactive Publication Date: 2009-12-09
北京京仪椿树整流器有限责任公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] (1) PN structure fast recovery diode, the power is easy to increase, but the forward voltage drop is generally relatively large, and the reverse recovery time is relatively long; PIN structure fast recovery diode, the power is small, and the reverse recovery characteristic is relatively hard
[0006] (2) The existing technology is difficult to solve the contradiction between the forward voltage drop, reverse recovery characteristics and high power of high-power fast soft recovery diodes, and the product cannot meet high-frequency, fast and high-power occasions, which limits fast thyristors, Application of high-power high-frequency devices such as GTO, IGCT and IGBT
[0007] (3) There is no domestic report on the manufacturing technology of high-power fast soft recovery diodes, no high-power fast soft recovery diode manufacturing process, no high-power fast soft recovery diode structure

Method used

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  • Process for producing high-power quick soft-restoring diode
  • Process for producing high-power quick soft-restoring diode

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0048] Preparation of P + PINN + Type high power fast soft recovery diode:

[0049] 1).Primary diffusion (closed expansion): cleaned original silicon wafer, diffused at a constant temperature in a 1200°C diffusion furnace, using 99.9999% pure gallium source for diffusion, with a surface concentration of 10 17 / cm 3 ;

[0050] 2). Remove P-type on one side: Use a grinder to grind off one side of the P-type diffuser;

[0051] 3). Phosphorus deposition: clean and remove the diffusion sheet on one side, diffuse at a constant temperature in a 1000°C diffusion furnace, and use a liquid source of phosphorus oxychloride (POCl 3 ) diffusion, the surface concentration is ≥1×10 19 / cm 3 ;

[0052] 4). Dephosphorization of P surface: use a screen printing machine to print the P-shaped surface, and corrode the phosphorus on the P-shaped surface;

[0053] 5). Phosphorus propulsion: clean the diffusion sheet, and propel it at a constant temperature in a 1200°C diffusion furnace;

[...

Embodiment 2

[0079] Preparation of P + PINN + Type high power fast soft recovery diode:

[0080] 1).Primary diffusion (closed expansion): clean the original silicon wafer, diffuse at a constant temperature in a diffusion furnace at 1250°C, use 99.9999% pure gallium source for diffusion, and the surface concentration is 10 18 / cm 3 ;

[0081] 2). Remove P-type on one side: Use a grinder to grind off one side of the P-type diffuser;

[0082] 3). Phosphorus deposition: clean and remove the diffusion sheet on one side, diffuse at a constant temperature in a 1150°C diffusion furnace, and use a liquid source of phosphorus oxychloride (POCl 3 ) diffusion, the surface concentration is ≥9×10 19 / cm 3 ;

[0083] 4). Dephosphorization of P surface: use a screen printing machine to print the P-shaped surface, and corrode the phosphorus on the P-shaped surface;

[0084] 5). Phosphorus propulsion: clean the diffusion sheet, and propel it at a constant temperature in a 1250°C diffusion furnace; ...

Embodiment 3

[0110] Preparation of P + PINN + Type high power fast soft recovery diode:

[0111] 1).Primary diffusion (closed expansion): clean the original silicon wafer, 1230 ℃ diffusion furnace constant temperature diffusion, using 99.9999% pure gallium source diffusion, the surface concentration is 10 18 / cm 3 ;

[0112] 2). Remove P-type on one side: Use a grinder to grind off one side of the P-type diffuser;

[0113] 3). Phosphorus deposition: clean and remove the diffusion sheet on one side, diffuse at a constant temperature in a 1100°C diffusion furnace, and use a liquid source of phosphorus oxychloride (POCl 3 ) diffusion, the surface concentration is ≥5×10 19 / cm 3 ;

[0114] 4). Dephosphorization of P surface: use a screen printing machine to print the P-shaped surface, and corrode the phosphorus on the P-shaped surface;

[0115] 5). Phosphorus propulsion: clean the diffusion sheet, and propel at a constant temperature of 1230°C diffusion furnace;

[0116] 6). Diffusion...

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Abstract

The invention relates to a production method of a high-power fast soft recovery diode which is a key component of a power semiconductor converter device. Corner, chip electron irradiation and other processes, solve the contradiction between the forward voltage drop, reverse recovery characteristics and high power of high-power fast soft recovery diodes, so that the reverse recovery characteristics of high-power fast soft recovery diodes are both fast and efficient Soft, meets the requirements of anti-merging, absorbing, and freewheeling supporting devices for high-power high-frequency devices such as fast thyristors, GTOs, IGCTs, and IGBTs. The power supply devices composed of them are widely used in steel, petrochemical, electric power, railway, and communication industries. .

Description

technical field [0001] The invention relates to a production method of a high-power fast soft recovery diode, a key component of a power semiconductor converter device, and a power supply device composed of the diode is widely used in iron and steel, petrochemical, electric power, railway and communication industries. Background technique [0002] At present, the key components used in power semiconductor converters are high-power fast recovery diodes, which include PN type and PIN type. [0003] Manufacturing process: one-time diffusion, single-sided P-type removal, phosphorus deposition, P-side dephosphorization, phosphorus advancement, round cutting, sintering, evaporation, corner grinding, corrosion protection, mid-test, electron irradiation, packaging, testing. [0004] Problems existing in the prior art: [0005] (1) PN type structure fast recovery diode, the power is easy to increase, but the forward voltage drop is generally relatively large, and the reverse recover...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/329H01L29/868
Inventor 黄耀先李玉柱李善谟
Owner 北京京仪椿树整流器有限责任公司