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Self-adapting contact probe set of multiple-set measurement

A self-adaptive, probe set technology, applied in the parts of electrical measuring instruments, measuring electricity, measuring devices, etc., can solve the problems of large measurement errors and strict sample processing requirements, and achieves elimination of errors, reduction of precision requirements, Avoid the effects of change

Active Publication Date: 2009-05-27
BEIJING INSPECT TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a multi-group measurement self-adaptive contact probe group to solve the problems of large measurement errors and strict sample processing requirements.

Method used

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  • Self-adapting contact probe set of multiple-set measurement
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  • Self-adapting contact probe set of multiple-set measurement

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Embodiment Construction

[0025] Such as figure 2 , 3 Shown is a schematic diagram of the probe set of the present invention, and the present invention is described by taking the resistivity measuring device for carbon products for aluminum as an example. The sample to be tested is a cylinder with a diameter of 50 mm and a length of 130 mm.

[0026] The self-adaptive contact probe set of multi-group measurement of the present invention comprises four groups of probe assemblies distributed at 90 degrees around the center, each probe assembly includes a probe assembly 5 and a mobile device, and the mobile device in this embodiment adopts The cylinder 2 and the probe assembly 5 are installed on the cylinder 2, and the cylinder 2 can advance and reset towards the center under the action of power.

[0027] It also includes a piston rod dust cover 3, one end of the piston rod dust cover 3 is fixed on the end face of the cylinder 2, and the other end is fixed on the seat body 51. The seat body 51 is made ...

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Abstract

The invention relates to a self-adapting contact probe set, which is characterized in that four probe assemblies with the surrounding centers distributed in 90 degrees are included, wherein each of the probe assemblies comprises probe components and a moving device, and the probe components are arranged on the moving device which can move forward to the center or reset under dynamic function. Each of the probe components comprises a base body, a spring and a probe; wherein the base body is provide with two shoulder holes, and each shoulder hole is internally provided with a probe and a spring. Under the function of the spring, one end of the probe extends out of the shoulder hole. The self-adapting contact probe set can not only finish sample measurement at one time and make sure that the contact force of each set of probe meets standard requirements, but also avoid the change of the equipotential surface of the sample in the rotating detection process. In addition, the self-adapting contact probe set is characterized by convenient use, high measurement accuracy, good data reproduction quality, low requirement of sample processing accuracy, etc.

Description

technical field [0001] The invention relates to a device for measuring resistance and resistivity of heterogeneous materials, in particular to a self-adaptive contact probe group for multi-group measurement. Background technique [0002] At present, in the device for measuring the resistivity of heterogeneous materials, a pair of conductive probes should be used to contact the surface of the sample to obtain the voltage drop between the two probes. The existing technology in China is to use manual To be done. Due to the particularity of carbon materials, it is generally necessary to measure 3-4 times evenly along the cylindrical surface of the cylindrical sample, and each measurement needs to rotate the sample 90 degrees or 120 degrees before measuring the next point; this requires loosening the conductive fixture , rotate the sample and re-clamp it; because the armor condition is different each time, the contact pressure between the probe and the sample surface changes, ca...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/073G01R27/02
Inventor 李红梅
Owner BEIJING INSPECT TECH
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