Unlock instant, AI-driven research and patent intelligence for your innovation.

Drilling depth test method for multilayer circuit board

A multi-layer circuit board and drilling depth technology, applied in the direction of electric/magnetic depth measurement, electromagnetic measuring devices, etc., can solve the problems of cost waste, damage to finished boards, and failure to meet the technical requirements of drilling depth control, so as to improve the test Speed, the effect of avoiding missed detection

Active Publication Date: 2016-03-30
SHENZHEN WUZHU TECH
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When drilling, the depth to which the drill bit reaches the inside of the circuit board is precisely controlled by the parameters of the drilling machine, but due to the difference between the interlayer thickness of the circuit board and the theoretical value during the pressing process, it is also subject to tolerances in the production process. The impact of the drilling depth parameters set according to the theory often cannot meet the customer's requirements
Usually the industry uses a depth gauge to test the drilling depth, but the accuracy of the depth gauge is low. Generally, it can only measure an approximate depth value, which cannot meet the technical requirements for high-precision drilling depth control.
Another test method is to slice and analyze the drilled part of the finished board and then use a microscope to measure the depth of the hole. This method is very accurate, but the efficiency is low, and the finished board will be destroyed, resulting in waste of cost.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Drilling depth test method for multilayer circuit board
  • Drilling depth test method for multilayer circuit board
  • Drilling depth test method for multilayer circuit board

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0021] In order to solve the problem of low test accuracy existing in the drilling depth testing scheme of the prior art, the present invention provides a drilling depth testing circuit of a multilayer circuit board and a drilling depth testing method based on the drilling depth testing circuit . see figure 1 , which is a structural schematic diagram of a multilayer circuit board with a drilling depth test circuit provided by the present invention. The multi-layer circuit board 100 includes N conductive layers L ar...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a multilayer circuit board drilling depth test method. The multilayer circuit board drilling depth test method includes the steps that parallel circuit modules and series circuit modules are manufactured on a plurality of conductive layers of a multilayer circuit board; a public testing bonding pad and a plurality of continuity testing bonding pads are formed on the conductive layers on the outer layer, wherein each continuity testing bonding pad respectively corresponds to one of the conductive layers; via holes are formed in the positions where the testing bonding pads are located, wherein the public testing bonding pad is electrically connected with the conductive layers through the via holes, and the continuity testing bonding pads are electrically connected with the conductive layers corresponding to the continuity testing bonding pads respectively through the via holes; drill holes are formed in the parallel circuit modules of the conductive layers on the outer layer and the series circuit modules of the conductive layers on the outer layer respectively; the continuity between the continuity testing bonding pads corresponding to a target conductive layer of the drill holes and the public testing bonding pad is detected, and the drilling depth is judged according to the detecting result of the continuity.

Description

technical field [0001] The invention relates to a circuit board testing technology, in particular to a method for testing the drilling depth of a multilayer circuit board. Background technique [0002] In the production process of multi-layer circuit boards, there are high requirements on the drilling process, including the control of the drilling depth of the finished board. Customers' precision requirements for drilling depth are generally limited by layers plus or minus a few mils (mil, a commonly used length unit in the circuit board industry, 1 mil = one-thousandth of an inch), that is, from the pressed multi-layer circuit Counting from the surface of the board, it is required to drill holes from the surface to the first layer of the board. When drilling, the depth to which the drill bit reaches the inside of the circuit board is precisely controlled by the parameters of the drilling machine, but due to the difference between the interlayer thickness of the circuit boa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B7/26
Inventor 徐学军赵南清
Owner SHENZHEN WUZHU TECH