Transient X-ray diffraction experiment method and special positioning bracket thereof

Abstract

The invention discloses a transient X-ray diffraction experiment method, comprising a vacuum target chamber (4) with a laser inlet (3), and a laser device (1) which is arranged outside the vacuum target chamber (4), wherein a focusing lens (5), a backlight target positioning point (7-1), a static diffraction target positioning point (7-2), a dynamic diffraction target positioning point (7-3) and receivers (9-1 and 9-2) are arranged in the vacuum target chamber (4). A special positioning bracket for the method is as follows: a T-shaped bracket (7) formed by a cross bar and a vertical bar is fixed in the vacuum target chamber (4); one end of the vertical bar is vertically fixed at the center of the cross bar; the backlight target positioning point (7-1) is fixed at the other end of the vertical bar; the vertical bar is coaxial with a normal line (10) of a backlight target surface passing through the target center; the static diffraction target positioning point (7-2) and the dynamic diffraction target positioning point (7-3) are respectively fixed at two ends of the cross bar and equal in distances to the center of the cross bar. By adopting the transient X-ray diffraction experiment method, a static experiment and a dynamic experiment can be simultaneously carried out in an experiment; static and dynamic experiment diffraction images are obtained, so that the transient X-ray diffraction experiment method has synchronism and high contrast.

Description

technical field [0001] The invention relates to a method for conducting diffraction experiments by using transient X-rays and a positioning bracket for positioning a backlight target and a diffraction target. The invention can be applied to the experimental layout of transient (ultrafast) X-ray diffraction to improve the precision and accuracy of measurement. Background technique [0002] Transient X-ray diffraction technology is equivalent to the free oscillation period of solid atoms and molecules because of its ultra-short X-ray pulse (pulse width of picoseconds, femtoseconds, etc.), which is useful for scientists to understand the extreme pressure, temperature and strain rate of solid materials. The kinetic response under such conditions is of great significance. This technology is a new means of understanding the microscopic material world, opens a new window for the study of condensed matter physics under extreme conditions, and serves as a bridge to communicate resea...

AI Technical Summary

Problems solved by technology

But so far, there is no literature report on using the same X-ray diffraction experimental device to conduct static experiments and dynamic experiments at the same time

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