Generating method and system of configuration file for test line

A configuration file and generation system technology, which is applied in the field of generation of configuration files for test lines, can solve problems such as mismatch between test plan and test software, prone to missing or wrong changes, time-consuming and labor-intensive problems, etc.

Active Publication Date: 2015-03-11
GOERTEK MICROELECTRONICS CO LTD
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Problems solved by technology

[0004] The purpose of the present invention is to provide a method for generating a configuration file for a test line, which aims to solve the problem of omission or wrong modification in the process of manually changing test configuration items in the prior art, causing development engineers and test engineers to Repeated confirmation is time-consuming and labor-intensive, and it is prone to mismatch problems between the test plan and the test software

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  • Generating method and system of configuration file for test line
  • Generating method and system of configuration file for test line
  • Generating method and system of configuration file for test line

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[0042] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0043] figure 1 It shows the implementation flow chart of the method for generating the test line configuration file provided by the embodiment of the present invention, and its specific steps are as follows:

[0044] In step S101, the test plan is read, and a test item list consisting of several test items is generated according to the content contained in the test plan, and the test item list is stored in the memory, and the test item list includes test items. Environment and test specification options.

[0045] In step S102, the test parameters involved in the test environment and test specifi...

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Abstract

The invention relates to the technical field of product test and provides a generating method and a generating system of a configuration file for a test line. The method comprises the following steps of reading a test plan, generating a test item list, and storing the test item list into a memory; performing validity detection on the test environment in the test item list and test parameters related to test specification options. When the validity detection passes, the test item list is screened, so as to select contents, which meet preset requirements, in the test item list; the contents, which meet the preset requirements, in the test item list are resolved, and parameters required by test software of the test line in the test item list are correspondingly mapped into a buffer memory; the parameters required by the test software of the test line in the buffer memory are generated into an ini configuration file in an .ini file format and are output, thereby realizing automated configuration of the test software. The method has the advantages of high configuration efficiency and difficulty in mistaking, manpower and material resources are saved, the development time is shortened, and the error rate is reduced.

Description

technical field [0001] The invention belongs to the technical field of product testing, and in particular relates to a method and system for generating configuration files for testing lines. Background technique [0002] At present, after the project approval is completed, the software group needs to be responsible for issuing the production line test plan and test software. Among them, the test plan is often in the form of an Excel file, which is specified according to the product specifications and production line test conditions proposed by the customer. Guide the production testing of the production line. The testing software is formulated according to the test plan, and the testing algorithm and test specifications are faithfully reflected to assist the production line in making shipment judgments. [0003] There is a one-to-one correspondence between the test plan and the test software, and it is reversible, that is, the test configuration items can be derived from the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 杜文峰
Owner GOERTEK MICROELECTRONICS CO LTD
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