Tray-oriented SMD sampling and counting equipment
A technology of equipment and trays, which is applied in the field of SMD sampling inspection and counting equipment, can solve the problems of separation of picking and inspection procedures, limited inspection platform, waste of resources, etc., to overcome the difficulty of normal adsorption of small-sized components, ensure order and The effect of operation convenience and vacuum negative pressure structure optimization
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[0028] In order to make the objectives, technical solutions and advantages of the present invention clearer, the following further describes the present invention in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.
[0029] In order to make the objectives, technical solutions and advantages of the present invention clearer, the following further describes the present invention in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention. In addition...
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