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Method for testing high-speed port performance on basis of low-speed port of Ethernet switch

A port test and switch technology, applied in data exchange network, data exchange through path configuration, network interconnection, etc., can solve the problems of inconvenient transportation, high maintenance and repair costs, and large size, and achieve simplified test methods, The effect of saving R&D costs

Inactive Publication Date: 2017-05-31
武汉微创光电股份有限公司
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

But, based on this method, on the one hand, test the high-speed port of switchboard and need the test instrument to have the same port with the tested port rate, promptly must adopt the high-bandwidth Ethernet performance tester; On the other hand, the high-bandwidth tester is expensive, High maintenance and repair costs, large volume, inconvenient handling

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  • Method for testing high-speed port performance on basis of low-speed port of Ethernet switch
  • Method for testing high-speed port performance on basis of low-speed port of Ethernet switch

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Embodiment

[0026] The tested 10-Gigabit industrial Ethernet switch has 48 Gigabit ports and 8 10-Gigabit ports, while the existing Smartbit only supports Gigabit forwarding rate, and the number of Gigabit Smartbit ports is limited. In order to test the performance of the 10G port, it is possible to test 2 10G ports each time, and establish a communication circuit for 20 Gigabit ports, 2 10G ports and the two ports of the Smart bit for data transmission and reception.

[0027] First: configure VLAN, configure Gigabit port P1 and 10 Gigabit port X1 as VLAN a0, Gigabit port P3 and 10 Gigabit port X1 as VLAN a1, Gigabit port P5 and 10 Gigabit port X1 as VLAN a2, ... Gigabit ports Configure P19 and 10GE port X1 as VLAN a9; configure Gigabit port P2 and 10GE port X2 as VLAN b0, Gigabit port P4 and 10GE port X2 as VLAN b1, and Gigabit port P6 and 10GE port X2 as VLAN b2. ... Gigabit port P20 and 10-Gigabit port X2 are VLAN b9; configure the Gigabit port as an Access port, and configure the 10-G...

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Abstract

The invention discloses a method for testing the high-speed port performance on the basis of low-speed ports of an Ethernet switch. The method comprises the following steps that a VLAN (virtual local area network) is configured for the low-speed ports and high-speed ports of the Ethernet switch, wherein the product of the number of the low-speed ports and the port speed is equal to the high-speed port speed; the forwarding flow direction relationship of the VLAN is configured; for the low-speed ports, except the first port and the last port, other low-speed ports are mutually connected, and the high-speed ports are mutually connected; one port of an Ethernet performance test instrument is connected with a first low-speed port of a switch to be tested; the other port of the Ethernet performance test instrument is connected with the last low-speed port of the switch to be tested, so that the test is performed. The method has the advantages that the performance test of the high-speed port of the Ethernet switch can be completed by the Ethernet performance test instrument with low bandwidth; the development cost is reduced; the test method is simplified.

Description

technical field [0001] The invention relates to a method for testing the performance of a high-speed port with a low-speed port, in particular to a method for testing the performance of a high-speed port based on a low-speed port of an Ethernet switch, and belongs to the technical field of computer network communication. Background technique [0002] With the development of data communication technology, the application of high-bandwidth Ethernet switches is becoming more and more common. In the research and development process of the high-bandwidth Ethernet switch, it is an important link to test the forwarding performance of the switch. [0003] A conventional method for testing the performance of an Ethernet switch in the prior art is to directly connect a port of a test instrument to a port of the switch under test, and the test instrument sends out a data packet for testing. But, based on this method, on the one hand, test the high-speed port of switchboard and need th...

Claims

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Application Information

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IPC IPC(8): H04L12/26H04L12/46
CPCH04L43/0817H04L12/4641
Inventor 尹德明
Owner 武汉微创光电股份有限公司
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