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Automatic test device used for testing uniformity of antenna radiation field

An automatic test device and a technology for testing antennas, which are applied in directions such as antenna radiation patterns, can solve problems such as low test efficiency and human operation errors, and achieve the effects of improving test accuracy, low production and maintenance costs, and easy implementation.

Active Publication Date: 2017-09-01
INST OF APPLIED ELECTRONICS CHINA ACAD OF ENG PHYSICS
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  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to accurately measure the uniformity of the antenna radiation field, and at the same time solve the problems of human error, low test efficiency, and accurate positioning of the probe, and ensure that the structure is compact and easy to implement. The invention provides a test antenna with uniform radiation field automatic test device

Method used

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  • Automatic test device used for testing uniformity of antenna radiation field
  • Automatic test device used for testing uniformity of antenna radiation field
  • Automatic test device used for testing uniformity of antenna radiation field

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Embodiment Construction

[0032] All features disclosed in this specification, or steps in all methods or processes disclosed, may be combined in any manner, except for mutually exclusive features and / or steps.

[0033] The invention relates to an automatic test device for radiation field uniformity in a strong electromagnetic environment. It consists of two parts, the test guide rail and the support platform. The test guide rail is a ring guide rail with a ring gear belt embedded in the inner side. Eight pan-tilts equipped with stepping motors are arranged on the guide rails, and the gears meshed with the ring gear belt are driven by the stepping motors to make the pan-tilts make circular motions along the annular guide rails; each pan-tilt is equipped with a servo, The machine controls the support rod on the pan-tilt to move radially along the circumference, so that the probe on the support rod can move radially along the guide rail, and the circular motion of the pan-tilt and the radial movement of ...

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Abstract

The invention discloses an automatic test device used for testing the uniformity of an antenna radiation field. The device comprises a regular geometric frame and a support bar separated from the geometric frame. The geometric frame is provided with a number of positioning bars capable of moving along the inner frame of the geometric frame. Each positioning bar is directed to the center of the geometric frame and is capable of telescoping. One end of the support bar is perpendicular to the cross section of the geometric frame and is directed to the center of the geometric frame. Probes are used for testing the antenna radiation field are arranged on one end of the support bar and the positioning bars. The automatic test device provided by the invention has the advantages of clever design, simple structure, easy operation, convenient use, low cost of making and maintaining, outstanding substantive characteristics and remarkable progress, and is suitable for large-scale application in the fields of antenna measurement and electromagnetic waves.

Description

technical field [0001] The invention belongs to the field of antenna measurement and electromagnetic wave, and specifically relates to an automatic test device for testing the uniformity of antenna radiation field. Background technique [0002] The judgment of the uniform area of ​​the antenna radiation field is the premise of conducting electromagnetic compatibility or effect experiments. Only when the uniform area of ​​the radiation field of the antenna is determined can the effective experimental boundary be determined, and then the experimental research within the scope of the standard regulations can be carried out. [0003] Different from the traditional electromagnetic compatibility field, strong electromagnetic pulses (such as high power microwave, High Power Microwave) are characterized by subtle differences in the parameters of each pulse (such as pulse width, peak power), which cannot be measured using traditional multiple measurements For uniformity evaluation, m...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/10
CPCG01R29/10
Inventor 高原吴双林江川刘廷军赵刚钟龙权秦风陈自东严志洋赵景涛杨浩王明
Owner INST OF APPLIED ELECTRONICS CHINA ACAD OF ENG PHYSICS
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