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Method and system for detecting pesticide residues in vegetables

A pesticide residue detection and pesticide residue technology, applied in the field of spectral analysis, can solve the problems of long analysis time, complex sample processing, expensive detection equipment and other problems, and achieve the effect of high accuracy, safe detection process, and real-time non-destructive detection.

Active Publication Date: 2019-12-06
中科谱光科技(北京)有限公司 +1
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Problems solved by technology

[0004] However, these methods require complex sample processing before detection, expensive detection equipment, long analysis time, require skilled professional technicians to complete, and cannot meet the requirements of rapid on-site detection of samples.

Method used

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  • Method and system for detecting pesticide residues in vegetables
  • Method and system for detecting pesticide residues in vegetables
  • Method and system for detecting pesticide residues in vegetables

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Embodiment Construction

[0017] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0018] figure 1 The schematic flow chart of the vegetable pesticide residue detection method provided by the embodiment of the present invention, as figure 1 As shown, the method includes:

[0019] Step S11, acquiring the first reflection spectrum data of the vegetable to be tested;

[0020] The embodiment of the present invention is applicable...

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Abstract

The invention provides a method and a system for detecting pesticide residue of vegetables. The method comprises the steps: acquiring first reflection spectrum data of vegetables to be detected; calculating a pesticide residue index of the vegetables to be detected according to a pre-established vegetable pesticide residue index model and the first reflection spectrum data; determining the degree of pesticide residue of the vegetables to be detected according to the pesticide residue index and a preset threshold value. According to the method and the system for detecting the pesticide residue of the vegetables, the degree of pesticide residue of the vegetables is determined through the reflection spectrum information of the vegetables to be detected, the pre-established pesticide residue index model and the preset threshold value, so that real-time nondestructive examination is achieved, the detection process is safe, convenient and quick, and the detection result is high in accuracy.

Description

technical field [0001] The invention relates to the technical field of spectral analysis, in particular to a method and system for detecting pesticide residues in vegetables. Background technique [0002] In recent years, due to the excessive use of chemical pesticides by vegetable farmers in the process of preventing and controlling vegetable diseases and insect pests, the amount of pesticide residues in vegetables has become higher and higher, directly endangering vegetable exports and the health of the people. Moreover, food poisoning incidents caused by excessive residues of various pesticides in vegetables have been frequently reported. Therefore, how to detect whether there are excessive pesticide residues in vegetables on the market is an urgent problem to be solved in current vegetable production. At present, governments around the world are also continuously strengthening the detection of pesticide residues. The requirements for the sensitivity and efficiency of pe...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/25
CPCG01N21/25
Inventor 张立福杨杭张霞
Owner 中科谱光科技(北京)有限公司
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