Capacitor end portion contact state detection method

Abstract

The invention discloses a capacitor end portion contact state detection method comprising the following steps: determining whether a to-be measured metalized film capacitor equivalent series resistance ESR is bigger than a threshold or not, if yes, the capacitor end portion contact state is poor, otherwise, the capacitor end portion contact state is good; the capacitor equivalent series resistance ESR parameter is the metalized film capacitor equivalent series resistance measured under 100Hz; the threshold is the metalized film capacitor equivalent series resistance theory calculating value under 100Hz. The method uses the capacitor 100Hz equivalent series resistance ESR parameter to detect the end portion contact state, thus preventing the capacitor temperature rise caused by poor end portion contact state under pulse current, preventing capacitor failure under electromotive force effect, and preventing severe influences on discharge efficiency and discharge waveform; the method can conveniently detect the capacitor end portion contact state, thus easily removing capacitors with poor end portion contact state from a batch of capacitors, and selecting the capacitors with good end portion contact state.

Description

technical field [0001] The invention belongs to the technical detection field of electrical equipment, and more specifically relates to a detection method for the contact state of a capacitor end. Background technique [0002] The loosening or detachment of the contact between the gold-sprayed layer and the metallized film electrode is one of the main reasons for the failure of the capacitor. When the capacitor works in AC steady state, the gold-sprayed layer falls off rarely occurs, but when the capacitor works in a high-field-strength pulse state, under the action of high peak pulse current, the gold-sprayed layer falls off from time to time . Studies have shown that the pulse current withstand capability of metallized film capacitors depends on the terminal contact state of the capacitor. When the pulse current flows, the electrical stress and mechanical stress generated lead to the aging of the terminal contact state of the metallized film capacitor. In the actual capa...

AI Technical Summary

Problems solved by technology

The gold-sprayed structure at the end is the main reason why the application of metallized film capacitors in the field of pulse power is limited

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