Method for determining relational parameters of transistors in array substrate gate drive circuit
A gate drive circuit and array substrate technology, applied in static indicators, instruments, etc., can solve problems such as difficulty in optimizing transistor design parameters, affecting the voltage or voltage waveform of control signal points, and achieve a simple and efficient simulation method and save layout space. , the effect of improving stability
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[0028] Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like numerals refer to like parts throughout. The embodiments are described below in order to explain the present invention by referring to the figures.
[0029] Refer below Figure 3 to Figure 6 A method for determining relational parameters of transistors in a gate driving circuit of an array substrate according to an embodiment of the present invention is described.
[0030] image 3 A flow chart showing a method for determining relational parameters of transistors in a gate driving circuit of an array substrate according to an exemplary embodiment of the present invention.
[0031] refer to image 3 , in step S10, it is determined that for the first transistor T 1 multiple of the first channel width-to-length ratio and for the second transistor T 2 The predetermined channel width-to-length ratio.
[0032] Here, t...
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