Three-dimensional imaging method based on error diffusion dithering algorithm
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SUZHOU JIANGAO OPTOELECTRONICS TECH
- Publication Date
- 2019-11-15
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to an imaging method, in particular to a three-dimensional imaging method based on an error diffusion dithering algorithm. Background technique
[0002] The structured light phase shift method plays an important role in the field of three-dimensional shape measurement because of its non-contact, fast processing and high precision characteristics. Various phase shifting methods, including three-step, four-step and N-step phase-shifting methods, are used for three-dimensional reconstruction of objects. The more the number of fringes projected by the phase-shifting method, the higher the accuracy.
[0003] In the actual three-dimensional measurement process of structured light, the binary image can be used to approximate sinusoidal fringes through defocus binary encoding technology, so as to solve the influence of nonlinear effects on three-dimensional measurement. The defocus binary code only has two values ​​of 0 and 1, which does...