The invention provides 16-step dual-frequency
grating phase shift profilometry capable of
absolute phase unwrapping in the three-dimensional sensor technology. The invention is characterized by usingcomputers to design codes to generate 16 dual-frequency
grating patterns, using a digital light
projector to image the
grating patterns on the surface of an object instantaneously in sequence, using apick-up device to
record the deforming
fringe pattern of the object, subsequently using the
functional relationship between the gratings with two frequencies, using the
absolute phase unwrapping method to directly realize
phase unwrapping of point to point in the whole field range and having no relation with the path for
phase unwrapping, effectively inhibiting accumulative
error diffusion, usingphase measuring profilometry to process the deforming fringes, accurately restoring the three-dimensional shape of the object and obtaining such digital information as deformation of the object and the like by further analyzing the
data processing results. The method can be used for measurement study of the characteristics of the object surface with the characteristic of
diffuse reflection. The method has the advantages of high
measurement precision and strong adaptability to the surface
topography of the object, etc.