A method and device for measuring polarization degree based on czt detector

A technology of detection device and measurement device, applied in radiation measurement, instruments and other directions, can solve the problems of inability to effectively restore the real energy curve, improve detection sensitivity, and different degrees of distortion, so as to improve detection efficiency and accuracy, and avoid energy Different, the effect of reducing the systematic error

Active Publication Date: 2021-02-09
NAT INST OF METROLOGY CHINA
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  • Description
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Problems solved by technology

In order to improve the detection efficiency of CZT space radiation detectors, in the prior art, for example, the above-mentioned multiple patents usually improve the production and processing technology of CZT crystals, or perform simple theoretical compensation on the energy response curve, but neither method can Effectively restore the real energy curve or improve detection sensitivity
A certain reason for the detection efficiency of the CZT detector is related to the incident angle of polarized light relative to the energy spectrum detection module. As the incident angle of the energy spectrum detection module changes, the intensity of polarized light received by the energy spectrum detection module will change accordingly. Therefore, the degree of distortion of the detection results at the corresponding energy spectrum detection modules under different polarized light scattering angles is obviously different, and none of the above patents considered how to solve this problem

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  • A method and device for measuring polarization degree based on czt detector
  • A method and device for measuring polarization degree based on czt detector
  • A method and device for measuring polarization degree based on czt detector

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Embodiment 1

[0050] Such as figure 1 As shown, Embodiment 1 discloses a polarization measuring device based on a CZT detector, at least comprising a CZT detection device 1, a ray generating device 2 and a polarizing device 3, and the CZT detection device 1 at least includes an annular housing 11 and is arranged on The arc-shaped energy spectrum detection module 12 in the annular housing 11, the arc-shaped energy spectrum detection module 12 at least includes an arc-shaped substrate 13 and an array CZT layer 14, and the array CZT layer 14 is fixedly arranged on the arc-shaped substrate 13 through a sealing layer 15 .

[0051] Preferably, the array CZT layer 14 includes at least one CZT crystal and an arc electrode 17 arranged on the CZT crystal, the high voltage electrode layer of the arc electrode 17 is connected to a power supply, and the collecting electrode layer of the arc electrode 17 is connected to a signal output circuit 18 , the signal output circuit 18 is disposed on the curved ...

Embodiment 2

[0076] This embodiment discloses a method for measuring the degree of polarization based on a CZT detector. In the case of no conflict or contradiction, the whole and / or part of the preferred implementations of other embodiments may be used as this embodiment.

Embodiment approach

[0077] According to a preferred embodiment, the method for measuring the degree of polarization at least includes the following steps:

[0078] S1: After adjusting the corresponding components in the entire optical path system to be coaxial with equal heights, generate γ-rays based on the radiation source 21 and generate collimated γ-rays through the collimator 22, and then pass the polarizing device 3 based on the collimated γ-rays generate a polarized light source,

[0079] Preferably, the radiation source 21 can be Am-241, Co-57, Cs-137, etc., the activity of the radiation source 2 can be 200mCi, and its polarized light output intensity is greater than or equal to 10 / s / cm^2;

[0080] S2: detecting the polarized light source based on the electronic detector 31 and generating a recoil electronic signal, and generating a signal for controlling the operation of the CZT detection device 1 based on the recoil electronic signal;

[0081] S3: Measure the energy distribution curves o...

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Abstract

The invention relates to a polarization measuring device based on a CZT detector, comprising a CZT detection device, a ray generating device and a polarizing device. The generating device can change the relative angle between it and the polarizing device while keeping the distance between it and the polarizing device constant by rotating it on the circular moving platform relative to the polarizing device. In the case of a CZT detection device, the incident angles formed by the polarized light with different scattering angles relative to the arc energy spectrum detection module are the same, so that the polarization degree measurement device can meet the requirements of polarized light with different scattering angles in the arc energy spectrum. Under the condition of having the same detection efficiency on the spectrum detection module, it is not necessary to change the distance between the radiation source and the polarizer to keep the energy loss of the radiation source in the air propagation process in multiple measurements consistent. Polarization measurement.

Description

technical field [0001] The invention relates to the field of high-energy ray detection, in particular to a method and device for measuring the degree of polarization based on a CZT detector. Background technique [0002] Semiconductor detector is a new type of nuclear radiation detector that has been developed rapidly since the 1960s. It has high energy resolution, good linear response, short pulse rise time, simple structure, high detection efficiency, and convenient operation. It is widely used in nuclear physics. It has been widely used in experiments and research. [0003] Nuclear radiation detectors, also known as space radiation detectors, work on the basis of the interaction of particles with materials. When particles pass through a material, the material absorbs some or all of its energy to ionize or excite. If the particles are γ-rays or X-rays, they first go through some intermediate processes to produce photoelectric effect, Compton effect or positive and negati...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01T7/00
CPCG01T7/005
Inventor 梁珺成杨志杰李正伟刘皓然亢锐勒孚河
Owner NAT INST OF METROLOGY CHINA
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