Method for detecting diffusion depth of metal atoms in amorphous alloy

An amorphous alloy, diffusion depth technology, applied in measurement devices, material analysis using radiation diffraction, material analysis using wave/particle radiation, etc., can solve problems such as insufficient detection accuracy, achieve a wide range of application systems, accurate and reliable data Effect

Pending Publication Date: 2020-04-10
WEINAN NORMAL UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In order to solve the above-mentioned deficiencies in the prior art, the purpose of the present invention is to provide a method for detecting the diffusion depth of metal atoms in amorphous alloys, which can solve the problems of insufficient detection accuracy of traditional methods, thereby obtaining a more accurate atomic diffusion depth

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  • Method for detecting diffusion depth of metal atoms in amorphous alloy
  • Method for detecting diffusion depth of metal atoms in amorphous alloy
  • Method for detecting diffusion depth of metal atoms in amorphous alloy

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Embodiment 1

[0024] A method for detecting the diffusion depth of metal atoms in an amorphous alloy, the method is as follows:

[0025] Step 1: the amorphous Zr 48 Cu 36 Ag 8 Al 8 The surface of the alloy was polished with sandpaper and mechanically polished in sequence. After ultrasonic cleaning and degreasing in acetone for 3 to 5 minutes, it was placed in the vacuum furnace of the magnetron sputtering coating equipment and vacuumed to complete the treatment of amorphous Zr. 48 Cu 36 Ag 8 Al 8 The surface of the alloy is plated with Ni, the thickness of the film is about 100nm, and finally Ni / Zr 48 Cu 36 Ag 8 Al 8 Amorphous alloy diffusion couple.

[0026] Step 2: Seal the coated cylindrical sample in a vacuum glass tube with a vacuum of 10 -4 Pa; to heat it, when heated to Zr 48 Cu 36 Ag 8 Al 8 The amorphous alloy / supercooled liquid phase region is kept at 683K for 60 minutes to prevent crystallization of the amorphous alloy, and the diffusion annealing heat treatment is ...

Embodiment 2

[0038] A method for detecting the diffusion depth of metal atoms in an amorphous alloy, the method is as follows:

[0039] Step 1: the amorphous Zr48 Cu 36 Ag 8 al 8 The surface of the alloy was polished with sandpaper and mechanically polished in sequence. After ultrasonic cleaning and degreasing in acetone for 3 to 5 minutes, it was placed in the vacuum furnace of the magnetron sputtering coating equipment and vacuumed to complete the treatment of amorphous Zr. 48 Cu 36 Ag 8 al 8 The surface of the alloy is plated with Si, the film thickness is about 100nm, and finally Si / Zr 48 Cu 36 Ag 8 al 8 Amorphous alloy diffusion couple.

[0040] Step 2: Seal the coated cylindrical sample in a vacuum glass tube with a vacuum of 10 -4 Pa; to heat it, when heated to Zr 48 Cu 36 Ag 8 al 8 The amorphous alloy / supercooled liquid phase region is kept at 723K for 10 minutes to prevent crystallization of the amorphous alloy, and the diffusion annealing heat treatment is completed...

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Abstract

A method for detecting the diffusion depth of metal atoms in amorphous alloy comprises: machining the amorphous alloy into a sample, conducting grinding and mechanical polishing, conducting ultrasoniccleaning and degreasing twice, and preparing a diffusion couple; sealing the coated sample in a vacuum glass tube, carrying out heat preservation and diffusion annealing heat treatment, quickly cooling the sample to room temperature, and analyzing the atom distribution condition of a metal / amorphous alloy diffusion couple by using a secondary ion mass spectrometer to obtain the element componentsof the surface layer of the sample and the distribution state of the elements along the longitudinal depth; measuring the depth of the sputtering pit analyzed by the secondary ion mass spectrometer by adopting an American Emerstuta step instrument; combining with a TEM result to complete atomic diffusion depth analysis, describing the diffusion coefficient of atoms in a uniform solid through a Fick second law, and obtaining the diffusion coefficient through the slope (m =-(4Dt)-1) of the square relationship between the logarithm of the specific activity and the depth. According to the method,the problem of insufficient detection precision of a traditional method can be solved, so that the relatively accurate atomic diffusion depth is obtained.

Description

technical field [0001] The invention relates to a method for measuring the diffusion coefficient of metal atoms in amorphous alloys, in particular to a method for detecting the diffusion depth of metal atoms in amorphous alloys. Background technique [0002] Amorphous alloy has the characteristics of uniform structure and uniform composition, without the formation of grain boundaries, twins, lattice defects, dislocations, stacking faults and other structural defects, so it has very good elastic limit and high yield strength, high Hardness and specific strength, very good corrosion resistance and wear resistance, and excellent characteristics such as easy processing and forming, it is an ideal high-strength engineering material. However, the limitations of size effect and poor room temperature plasticity of amorphous alloys hinder their application as engineering structural materials. In order to solve the limitations of the size effect and poor room temperature plasticity o...

Claims

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Application Information

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Patent Type & AuthorityApplications(China)
IPC IPC(8): G01N23/20G01N23/2202G01N23/2258
CPCG01N23/2258G01N23/20G01N23/2202G01N2223/05G01N2223/081
Inventor孙琳琳焦更生卢国锋张晶
OwnerWEINAN NORMAL UNIV