A Monitoring System of Scientific Instrument Working Condition Based on Control Computer
A technology for controlling computers and working states, applied in scientific instruments, instruments, measuring devices, etc., can solve the problem that the cuvettes are stained with a lot, the lens cannot transmit the light of the spectrophotometer stably, and the cuvettes cannot be fully wiped clean, etc. problems, to achieve the effect of reducing the monitoring error of the working state and improving the monitoring accuracy
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0040] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0041] see Figure 1-12 , the present invention provides a technical solution: a monitoring system for the working state of scientific instruments based on a control computer, comprising a spectrophotometer body 1, the outer side of the spectrophotometer body 1 is provided with a monitoring system for monitoring the working state of the spectrophotometer body 1 The monitoring device 2, the monitoring device 2 comprises a camera head 3...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More - R&D
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com



