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Visual inspection system LED light source illumination optimization method and used experimental equipment

A technology of LED light source and visual inspection, which is applied in the direction of lighting and heating equipment, measuring devices, lighting devices, etc., can solve problems such as not considering the influence of height, achieve improved lighting effects and detection efficiency, strong universality, and wide application range Effect

Pending Publication Date: 2022-01-11
JIANGSU UNIV OF TECH
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Problems solved by technology

However, the optimization process does not consider the influence of height on the lighting effect, so the proposed light source optimization scheme has certain limitations

Method used

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  • Visual inspection system LED light source illumination optimization method and used experimental equipment
  • Visual inspection system LED light source illumination optimization method and used experimental equipment
  • Visual inspection system LED light source illumination optimization method and used experimental equipment

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Embodiment

[0154] Embodiment: Below in conjunction with accompanying drawing, the present invention is described in detail. The described embodiment of the present invention is only a preferred embodiment of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work belong to the protection scope of the present invention.

[0155] A method and device for optimizing the illuminance of an LED light source in a visual inspection system, the flow chart of the optimization method is as follows figure 1 As shown, it specifically includes the following steps:

[0156]Step 1: Design an experimental equipment, including a test bench, a light source bracket, an illuminance meter, an LED light source array, and a control system. An optical breadboard is arranged at the bottom of the test bench, and a horizontal target plane is fixed on the upper side of the test bench. A first ...

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Abstract

The invention discloses a visual inspection system LED light source illumination optimization method and used experimental equipment, and the optimization method comprises the steps of: installing an LED light source matrix on the existing experimental equipment, then building a base coordinate system and a wrist coordinate system which have the same direction and different original point positions, then building a mathematical model of a single LED light source, and acquiring an illumination value of the LED light source matrix to each point of a target plane; establishing a plane illumination effect evaluation function for the LED matrix light source on the basis of factors of illumination uniformity, illumination gradient change, illumination centering degree, average illumination and target and background distinction degree, and performing optimization solution to obtain space pose parameters of the LED light source with the optimal illumination effect; the experimental equipment comprises an experiment table, a four-axis light source support used for installing an LED light source matrix, an illuminometer used for detecting the illumination value of each point of a target plane on the experiment table, and a control system used for calculation and analysis. The visual inspection system is reasonable in optimization target and can improve the visual inspection accuracy of industrial products.

Description

technical field [0001] The invention relates to the technical field of computer image processing, in particular to a visual detection system LED light source illuminance optimization method and experimental equipment used. Background technique [0002] In the process of visual inspection of integrated circuit chip packaging quality, according to different needs of customers, feeding trays or vibrating hoppers are usually used. Detection efficiency, but it also puts forward higher requirements for the lighting effect of visual inspection. Existing single-chip visual defect detection, such as the invention patent with application number 201810869324.7, uses multiple chips for image acquisition, such as the invention patent with application number 202011628232.3, which mainly uses optimization algorithms, but it does not fully consider the impact of lighting effects on vision. Detect system impact. However, the existing light source optimization methods mainly focus on LED in...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/956G01N21/88F21V21/14
CPCG01N21/956G01N21/8806F21V21/14
Inventor 巢渊徐鹏朱俊杰马成霞史璠梁栋
Owner JIANGSU UNIV OF TECH
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