Device and method for measuring scattering particles by using dynamic polarized light

A technology of scattering particles and measuring devices, which is applied in the direction of measuring devices, particle and sedimentation analysis, particle size analysis, etc., to achieve the effect of increasing concentration, simple structure and low cost

Inactive Publication Date: 2010-04-28
UNIV OF SHANGHAI FOR SCI & TECH
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Problems solved by technology

[0004] The present invention aims at the problem of difficulties in the existing measurement of high-concentration particles, and proposes a dynamic polarized light scattering particle measurement device and measurement method, which are used to solve the problem of measuring volume percentage concentration of 0.1% to 10% and particle diameter of 10 to 1000nm The technical issue of particle size between

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  • Device and method for measuring scattering particles by using dynamic polarized light
  • Device and method for measuring scattering particles by using dynamic polarized light
  • Device and method for measuring scattering particles by using dynamic polarized light

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Embodiment Construction

[0014] like figure 1 The shown dynamic polarized light scattering particle measurement principle block diagram, the medium and high concentration particle measurement device based on dynamic polarized light scattering of the present invention includes a laser 1, a polarizer 2, a half-wave plate 3, a lens 4, a sample cell 5, Aperture diaphragm 6, 8, analyzer 7, photomultiplier tube 9, digital correlator 10, microcomputer 11.

[0015] The light emitted by the laser 1 enters the incident light path composed of the polarizer 2 , the half-wave plate 3 and the lens 4 in sequence. The polarizer 2 is used to increase the degree of polarization of the laser to ensure that the incident light is highly linearly polarized light. The half-wave plate 3 is used to change the polarization direction of the incident light, where the polarization direction is perpendicular to the scattering surface (ie, the horizontal plane). The lens 4 is used to focus the incident laser light on a point in t...

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Abstract

The invention relates to a device and a method for measuring scattering particles by using dynamic polarized light. The laser light emitted by a laser enters a polarizer, a half-wave plate and an incident light path consisting of lenses in turn; light output by lenses focus radiates on a particle sample in a sample cell; the scattered light, which is generated by sample particles irradiated by laser beams and is vertical to the direction of incident laser light, enters an aperture stop, an analyzer and a receiving light path consisting of the aperture stop in turn and finally enters a photomultiplier to convert optical signals into electric signals which are output and enter a digital correlator to perform counting, and finally, data is sent into a microcomputer for processing. The device and the method improve the concentration of a measurable sample, and a measuring system has a simple structure, strong applicability, convenient later maintenance and a low cost.

Description

technical field [0001] The invention relates to a device for measuring the particle size of nanoparticles, in particular to a device and method for directly measuring the particle size of nanoparticles at medium and high concentrations. Background technique [0002] Dynamic light scattering (Dynamic Light Scattering, DLS) technology is an important means to detect the motion properties of particles. Its main application is to quickly and accurately measure the translational diffusion coefficient of macromolecules or particles in solution, so as to know their size or hydrodynamic radius. At present, DLS technology has been widely used in the measurement of nanoparticle particle size in the fields of medicine, aerospace, environment, chemical industry, etc., and has become a standard method for the characterization of ultrafine particles in dilute solutions. [0003] However, due to the limitation of the design principle, the current DLS method is only suitable for the measure...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/02
Inventor 杨晖郑刚戴曙光
Owner UNIV OF SHANGHAI FOR SCI & TECH
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