Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device and method for measuring scattering particles by using dynamic polarized light

A technology of scattering particles and measuring devices, which is applied in the direction of measuring devices, particle and sedimentation analysis, particle size analysis, etc., to achieve the effect of increasing concentration, simple structure and low cost

Inactive Publication Date: 2010-04-28
UNIV OF SHANGHAI FOR SCI & TECH
View PDF0 Cites 34 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The present invention aims at the problem of difficulties in the existing measurement of high-concentration particles, and proposes a dynamic polarized light scattering particle measurement device and measurement method, which are used to solve the problem of measuring volume percentage concentration of 0.1% to 10% and particle diameter of 10 to 1000nm The technical issue of particle size between

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device and method for measuring scattering particles by using dynamic polarized light
  • Device and method for measuring scattering particles by using dynamic polarized light
  • Device and method for measuring scattering particles by using dynamic polarized light

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0014] like figure 1 The shown dynamic polarized light scattering particle measurement principle block diagram, the medium and high concentration particle measurement device based on dynamic polarized light scattering of the present invention includes a laser 1, a polarizer 2, a half-wave plate 3, a lens 4, a sample cell 5, Aperture diaphragm 6, 8, analyzer 7, photomultiplier tube 9, digital correlator 10, microcomputer 11.

[0015] The light emitted by the laser 1 enters the incident light path composed of the polarizer 2 , the half-wave plate 3 and the lens 4 in sequence. The polarizer 2 is used to increase the degree of polarization of the laser to ensure that the incident light is highly linearly polarized light. The half-wave plate 3 is used to change the polarization direction of the incident light, where the polarization direction is perpendicular to the scattering surface (ie, the horizontal plane). The lens 4 is used to focus the incident laser light on a point in t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
particle diameteraaaaaaaaaa
particle diameteraaaaaaaaaa
refractionaaaaaaaaaa
Login to View More

Abstract

The invention relates to a device and a method for measuring scattering particles by using dynamic polarized light. The laser light emitted by a laser enters a polarizer, a half-wave plate and an incident light path consisting of lenses in turn; light output by lenses focus radiates on a particle sample in a sample cell; the scattered light, which is generated by sample particles irradiated by laser beams and is vertical to the direction of incident laser light, enters an aperture stop, an analyzer and a receiving light path consisting of the aperture stop in turn and finally enters a photomultiplier to convert optical signals into electric signals which are output and enter a digital correlator to perform counting, and finally, data is sent into a microcomputer for processing. The device and the method improve the concentration of a measurable sample, and a measuring system has a simple structure, strong applicability, convenient later maintenance and a low cost.

Description

technical field [0001] The invention relates to a device for measuring the particle size of nanoparticles, in particular to a device and method for directly measuring the particle size of nanoparticles at medium and high concentrations. Background technique [0002] Dynamic light scattering (Dynamic Light Scattering, DLS) technology is an important means to detect the motion properties of particles. Its main application is to quickly and accurately measure the translational diffusion coefficient of macromolecules or particles in solution, so as to know their size or hydrodynamic radius. At present, DLS technology has been widely used in the measurement of nanoparticle particle size in the fields of medicine, aerospace, environment, chemical industry, etc., and has become a standard method for the characterization of ultrafine particles in dilute solutions. [0003] However, due to the limitation of the design principle, the current DLS method is only suitable for the measure...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/02
Inventor 杨晖郑刚戴曙光
Owner UNIV OF SHANGHAI FOR SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com