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Indirect test method for voltage drops on relay contacts

A technology of relay contacts and testing methods, applied in circuit breaker testing, measuring current/voltage, instruments, etc., can solve problems such as insecurity, inconvenient equipment, and difficulties

Inactive Publication Date: 2011-09-21
INST OF ELECTRONICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The current test is relatively easy, but the voltage drop test is much more difficult. It cannot be tested directly from the outside of the equipment. To test from the inside of the equipment, it is necessary to directly connect the voltmeter test leads to the contacts of the relay. This operation is very difficult for the assembled equipment. inconvenient, unsafe

Method used

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  • Indirect test method for voltage drops on relay contacts
  • Indirect test method for voltage drops on relay contacts
  • Indirect test method for voltage drops on relay contacts

Examples

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Embodiment

[0020] Put four terminals Test point 1, Test point 2, Test point3 and Test point 4 on the test equipment, the positive end of the 28V DC power supply is connected to Test point 1, the power control equipment 28VInput, the negative end is connected to Test point 4, and the power control equipment 28V Connect to Input RTN, connect the positive terminal of the load to Test point 2 and the 28V Output of the power control device, and connect the negative terminal of the load to Test point 3 and the 28V Output RTN of the power control device (such as figure 2 shown). When the equipment is working normally, measure the voltage drop U from Test point 1 to Test point 2 P , Test point 3 to Test point 4 voltage drop U N , the difference between the two is U C .

[0021] The method of the present invention can be tested from the outside of the device without opening the case, without touching the internal circuit, and without potential safety hazards. It only needs to make a simple te...

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Abstract

The invention discloses an indirect test method for voltage drops on relay contacts in power control, relating to a relay test technique. In the method, the test can be performed from the outside of a device without opening a case, contacting internal circuits and producing potential safety hazards, and the test can be implemented just by arranging a simple test circuit at the outside of the device and then connecting the simple test circuit with the device by virtue of a connector. The indirect test method for the voltage drops on relay contacts in power control disclosed by the invention is accurate and credible in test results, and safe and convenient in test process.

Description

technical field [0001] The invention relates to the technical field of relay testing, and relates to a method for testing the voltage drop of a current on a contact after a relay contact is closed. Using the method of the invention greatly improves the safety of the test without losing accuracy. Background technique [0002] At present, relays are widely used in power electronic equipment for power control. Accurately measuring the voltage drop and current flowing on the relay contacts can calculate the heat consumption generated on the contacts, which can facilitate reliability analysis. The current test is relatively easy, but the voltage drop test is much more difficult. It cannot be tested directly from the outside of the equipment. To test from the inside of the equipment, it is necessary to directly connect the voltmeter test leads to the contacts of the relay. This operation is very difficult for the assembled equipment. Inconvenient and unsafe. Contents of the inve...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/00G01R31/327
Inventor 吴玉田张平禹卫东
Owner INST OF ELECTRONICS CHINESE ACAD OF SCI
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