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Algorithm for sampling voltage peak in sudden change of load of high-power battery test equipment

A technology for battery testing and load mutation. It is used in the measurement of electrical variables, AC/pulse peak measurement, and electrical measurement. It can solve the problem of difficulty in sampling the voltage rising peak, and achieve the effect of the algorithm being practical.

Inactive Publication Date: 2015-05-27
安徽省临泉县嘉柏列科技有限公司
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  • Application Information

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Problems solved by technology

[0003] The purpose of the present invention is to provide a high-power battery testing equipment sampling load mutation peak voltage algorithm to solve the problem of difficult sampling of the voltage rise peak value when the battery testing equipment sampling load mutation in the prior art

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  • Algorithm for sampling voltage peak in sudden change of load of high-power battery test equipment

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Embodiment Construction

[0008] The high-power battery test equipment sampling load mutation voltage peak algorithm is characterized in that: when the high-power battery test equipment load abruptly is sampled by the AD sampling chip, the high-power battery test equipment load voltage rises and falls within N time intervals t, and the value is calculated. Generate a load sudden change voltage curve of high-power battery test equipment, time as the x-axis and voltage as the y-axis in the high-power battery test equipment load sudden change voltage curve; then establish the load sudden change voltage curve of the high-power battery test equipment when the voltage rises The slope equation of the voltage rising straight line in the figure y=k1×x+b1, where k1 is the slope of the rising straight line, b1 is the value of the intersection of the rising straight line and the y-axis coordinate, and the load mutation voltage curve of the high-power battery test equipment when the voltage drops The slope equation ...

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Abstract

The invention discloses an algorithm for sampling a voltage peak in the sudden change of the load of high-power battery test equipment. An AD sampling chip is utilized to sample the rising value and dropping value of load voltage within a certain time interval during the sudden change of the load of the high-power battery test equipment, a voltage curve graph for the sudden change of the load of the high-power battery test equipment is generated, and a voltage-rising straight line slope equation and a voltage-dropping straight line slope equation are then established; and finally, according to the slope equations, an intersectional voltage value between the voltage-rising straight line and the voltage-dropping straight line is worked out, and approximates the voltage peak in the sudden change of the load of the high-power battery test equipment.

Description

technical field [0001] The invention relates to the field of battery detection methods, in particular to a sampling load sudden change voltage peak algorithm of high-power battery testing equipment. Background technique [0002] During the load mutation process of high-power battery test equipment, the output voltage will have a rapid rising phase and a rapid falling phase. Since the AD sampling chip requires a certain sampling processing time, and the voltage rise and fall time is very short, it is difficult to sample the peak value of the sudden load voltage rise of the high-power battery test equipment. If the maximum voltage obtained by AD sampling is used as the The disadvantage of the voltage rising peak value is that the sampled voltage value may be in the rising region or the falling region, and the sampled voltage peak value is not accurate enough. SUMMARY OF THE INVENTION [0003] The purpose of the present invention is to provide a high-power battery testing eq...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R19/04G01R31/36
Inventor 黄俊英张云涛陈全崔天
Owner 安徽省临泉县嘉柏列科技有限公司