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Method for monitoring discharge energy instantaneous value and accumulation value of klystron

A klystron, instantaneous value technology, applied in the direction of testing dielectric strength, AC/pulse peak measurement, etc., can solve problems such as reducing test efficiency, inability to accurately reflect the instantaneous value of discharge energy, and inability to judge the size of the cumulative arc energy value. , to achieve the effect of improving efficiency and safety

Inactive Publication Date: 2014-01-15
INST OF ELECTRONICS CHINESE ACAD OF SCI
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AI Technical Summary

Problems solved by technology

This method cannot judge the cumulative value of the arc energy, nor can it accurately reflect the instantaneous value of the discharge energy.
The use of this kind of ignition protection will either cause the threshold setting to be too low and frequent discharge failures, which will reduce the test efficiency, or the risk of klystron damage will be increased due to the threshold setting being too high

Method used

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  • Method for monitoring discharge energy instantaneous value and accumulation value of klystron
  • Method for monitoring discharge energy instantaneous value and accumulation value of klystron
  • Method for monitoring discharge energy instantaneous value and accumulation value of klystron

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Embodiment Construction

[0024] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0025] attached figure 1 Shown is the structural diagram that realizes the monitoring device of the discharge energy instantaneous value and cumulative value of klystron in the present invention and comprises; Overcurrent signal acquisition and processing circuit 1, overcurrent signal peak value sampling and measuring circuit D1, overcurrent signal pulse width Measuring circuit D2, over-current peak value comparison circuit 6, over-current pulse width value comparison circuit 13, over-current peak value exceeding times acquisition and counting circuit D3, value comparison circuit 18, fault signal comprehensive processing circuit 20, triggering of linear pulse modulator Device 6a, linear pulse modulator 20a, wherein:

[0...

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Abstract

The invention discloses a method for monitoring a discharge energy instantaneous value and an accumulation value of a klystron. According to the invention, when sparking occurs at a klystron, collection and integrated logic processing of a discharge over-current waveform peak value, a pulse width and the number of times for sparking are carried out, thereby determining the amount of the instantaneous discharge energy and the amount of the accumulation discharge energy when sparking occurs at the klystron. On the basis of utilization of the amount of the discharge energy, the duration time of the pulse high voltage loaded on the klystron is controlled, so that the metal burr inside the klystron can be removed by fully utilizing the discharge energy on the premise of security protection of the klystron and thus an objective of improvement of the voltage-withstanding testing efficiency of the klystron can be achieved. Therefore, the provided method is especially suitable for an occasion of klystron testing with utilization of a linear pulse modulator and also can be applied to testing equipment of vacuum devices that include other types of klystrons, travelling wave tubes and gyrotrons and the like and have discharge energy restrictive measures.

Description

technical field [0001] The invention relates to the technical field of electric vacuum devices, and is a method for improving the efficiency of a klystron withstand voltage test (sophisticated test), and is especially suitable for testing a klystron by a linear pulse modulator. Background technique [0002] The klystron withstand voltage test (also called aging test) is one of the necessary test links in the development and production process of the klystron. The klystron will form a lot of microscopic metal burrs inside due to the technical limitations of the processing technology. The metal burrs in the electron gun area with high field strength will produce a tip discharge phenomenon (also called a sparking phenomenon) during the voltage application process of the klystron. The ions generated during the discharge process may bombard the surface of the cathode, causing damage to the cathode material, and then shorten the life of the cathode or even damage the failure. Th...

Claims

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Application Information

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IPC IPC(8): G01R31/12G01R19/04
Inventor 徐旭哲蔡政平武志勇郭昊杰边陲
Owner INST OF ELECTRONICS CHINESE ACAD OF SCI
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