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A method and system for automatically classifying failure information of a cis image sensor

An image sensor and failure information technology, which is applied in the direction of instruments, special data processing applications, electrical digital data processing, etc., can solve the problems of inaccuracy, low efficiency of statistics and classification, etc., so as to improve production efficiency and avoid low efficiency and inaccurate Accurate questions and realize the effect of automatic classification analysis

Active Publication Date: 2017-10-31
中芯国际集成电路制造(深圳)有限公司 +1
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Problems solved by technology

[0004] In view of the shortcomings of the prior art described above, the purpose of the present invention is to provide a method and system for automatically classifying failure information of CIS image sensors, which is used to solve the problem of manual statistics and classification of failure information of CIS image sensors in the prior art. The inefficiency and imprecision of the

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  • A method and system for automatically classifying failure information of a cis image sensor
  • A method and system for automatically classifying failure information of a cis image sensor
  • A method and system for automatically classifying failure information of a cis image sensor

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Embodiment

[0047] This embodiment provides a method for automatically classifying failure information of a CIS image sensor, such as figure 2 As shown, the automatic classification method includes:

[0048] The CIS image sensor outputs a picture file of the detection result. Further, the detection result picture file is a BMP (abbreviation for bitMap) picture file, and may also be other types of picture files. BMP is an integration of pixels with a certain width and height, including 2-color bitmap, 16-color bitmap, 256-color bitmap and 24-bit bitmap. Semiconductor testing equipment generally outputs a black and white image of a 256-color bitmap. Observe with the naked eye, it can be found that where there is a failure bit, it will display a darker color with different gray levels, and other places will display a whiter color with different gray levels. , see figure 1 shown.

[0049] Interpret the test result picture file and extract failure information. The specific process include...

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Abstract

The invention provides a method and system for automatically classifying failure information of a CIS image sensor. The automatic classification method includes: the CIS image sensor outputs a detection result picture file; the detection result picture file is a BMP picture file; and the detection result picture file is interpreted , extracting the failure information, the specific process includes: converting the BMP image file into a hexadecimal file; according to the feature of jumping in the pixel color of the normal position and the failure position, find the gray value of the failure position by hierarchical clustering analysis method degree value range; convert the failure information into a result file in a standard text format; automatically classify the failure information in the result file according to the self-defined failure mode; display the automatic classification result. The invention quickly solves the difficult problem of automatically classifying and analyzing the image test results of CIS products, and avoids the long-standing low efficiency and inaccurate problems of manually using eyes to count and classify.

Description

technical field [0001] The invention belongs to the technical field of semiconductor detection, and relates to a method and system for automatically classifying failure information of a CIS image sensor. Background technique [0002] With the development of mobile phone cameras, CMOS image sensors are changing with each passing day. From 20K pixels in the early years to 32M pixels now, different companies, universities, and research institutions around the world are constantly developing CMOS image sensors, and new technologies are produced every year. With the continuous reduction of pixel design, it poses new challenges to the production process and quality of CMOS image sensors. In order to ensure the quality of the product, each image sensor needs to be tested and inspected, and the corresponding BMP picture can be obtained. From the BMP picture, the graphic characteristics of various failure modes on the problematic product can be seen. [0003] In order to obtain inf...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/30G06K9/46G06K9/62
CPCG06F18/23G06F18/241
Inventor 康栋林光启
Owner 中芯国际集成电路制造(深圳)有限公司
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