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Integrated probe and test and measurement instrument with integrated probe

A measuring instrument and an integrated technology, applied in the field of measuring probes, can solve problems such as high cost and loose threads, and achieve the effects of reliable use, fast connection and cost reduction

Active Publication Date: 2014-10-29
SUZHOU RIGOL PRECISION ELECTRIC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0014] The technical problem to be solved by the present invention is to provide an integrated probe for the problem that the BNC body and the shell of the probe are threaded in the prior art, the cost is high, and the thread may be loose.

Method used

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  • Integrated probe and test and measurement instrument with integrated probe
  • Integrated probe and test and measurement instrument with integrated probe
  • Integrated probe and test and measurement instrument with integrated probe

Examples

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Embodiment Construction

[0059] Embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings. refer to Figure 8 , the parts in the figure that are the same as those in the prior art use the same reference numerals. The integrated probe includes a probe interface 6, a cable 1, and a probe front end 100, combined with reference Figure 9 and Figure 12 , the probe front end 100 includes a front end assembly 101, a BNC connector 102; the front end assembly 101 includes a PCB board 1011, a probe pin 1012 welded on the PCB board 1011 and a fixed pin 1013, a compensation circuit 1030 installed on the PCB board 1011, installed on The metal shielding tube 1014 outside the PCB board 1011 also has a front-end insulating layer 1015 between the PCB board 1011 and the metal shielding tube 1014; the front-end insulating layer 1015 of this preferred embodiment can be formed by injection molding; as another example , the probe pin 1012 may not be sol...

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PUM

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Abstract

The invention discloses an integrated probe and a test and measurement instrument with an integrated probe and relates to the field of electrical variable testing. The integrated probe contains a front-end assembly, a cable core and a BNC connector. The front-end assembly contains a PCB, a probe and a fixation pin which are installed on the PCB, a compensating circuit mounted on the PCB, a front-end insulating layer covering the PCB and the compensating circuit, and a metallic shielding tube installed outside the front-end insulating layer. The BNC connector contains a BNC shell and a BNC core. The BNC shell contains a cable connecting part and a front-end assembly connecting part. One end of the BNC core is connected with the cable core, and the other end of the BNC core is connected with the fixation pin. The integrated probe also contains an integrated injection rubber-covered layer which is fixedly installed on the external surface of the front-end assembly connecting part of the BNC connector and on the external surface of the front-end assembly so as to fixedly connect the BNC connector and the front-end assembly. The front-end insulating layer also adopts the injection rubber-covered layer. Thus, during injection of the integrated injection rubber-covered layer, the metallic shielding tube doesn't deform, and equivalent capacitance at the front end of the probe is stable.

Description

technical field [0001] The invention relates to the field of electric variable testing, in particular to a measuring probe of a device for displaying electric variable or waveform. Background technique [0002] A probe is a device used to test and collect signals from measuring instruments, and it inputs the collected signals into instruments and meters. Usually, the probe and the instrument are designed as a detachable structure to facilitate the handling, arrangement and use of instruments and meters. The most common test and measurement instruments include oscilloscopes, spectrum analyzers, and data acquisition devices. [0003] refer to figure 1 , the prior art probe includes a cable 1, a BNC (coaxial cable connector) body 3, a probe front end 5, and a probe interface 6. [0004] refer to figure 2 , The prior art probe front end 5 includes: a probe 14 , a probe interface 13 , a PCB board and a compensation circuit 16 , a probe core shell 15 , a shielding tube 12 , a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/067
Inventor 张瑞忠王悦王铁军李维森
Owner SUZHOU RIGOL PRECISION ELECTRIC TECH