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Nonlinear imaging using dual-band pulse complexes

A pulse complex, non-linear technology, applied in the use of wave/particle radiation, applications, radio wave measurement systems, etc., can solve problems such as generating strong interference noise

Inactive Publication Date: 2017-06-06
SURF TECH AS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Multiple scattering of EL and EM waves from strong scatterers often produces strong interference noise in measurements and images

Method used

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  • Nonlinear imaging using dual-band pulse complexes

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Embodiment Construction

[0089] 5.1 Background of 1st and 3rd order scattering

[0090] Exemplary embodiments according to the invention are presented below.

[0091]The method and the structure of the apparatus are applicable to both electromagnetic (EM) and elastic (EL) waves, and to a wide frequency range with a wide range of applications. For EL waves, the method and apparatus can be applied to shear and compression waves in the infrasonic, sonic, and ultrasonic frequency ranges. In the embodiments, ultrasound measurements or imaging for both technical and medical applications are described by way of example. This description is for illustrative purposes only and is not meant to be limiting of the invention, which is defined in its broadest aspect by the claims appended hereto.

[0092] Most unwanted noise in pulse-echo measurements and imaging originates from multiple scattering of the transmitted pulse. This noise is called multiple scattering noise or impulse reverberation noise. Since for ...

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Abstract

The present invention presents methods and apparatus for measuring or imaging regions of an object using waves of a general nature, such as electromagnetic waves (EM) and elastic waves (EL), wherein the material parameters for wave propagation and scattering in the object depend on the wave field strength. The present invention specifically addresses the suppression of 3rd order multiple scatter noise called pulse reverberation noise, and the suppression of linear scatter components to enhance signal components from non-linear scatter. Pulse reverberation noise is divided into three classes, where the present invention is dedicated to class I and class II 3rd order multiple scattering, which are produced by the same three scatterers, but in reverse order. A method dedicated to achieving close to the same sensitivity to impulse reverberation noise of classes I and II, which simplifies the suppression of the two combined classes, and a method for the estimation of the suppression of impulse reverberation noise, It compensates for the difference between Class I and Class II noise. The method is based on the transmission of a dual-band pulse complex comprising low frequency (LF) pulses and high frequency (HF) pulses, where the LF pulses are used to nonlinearly manipulate object parameters observed by the co-propagating HF pulses. One or both of the scattered and transmitted components from the HF pulse are picked up and further processed to suppress pulse reverberation noise and enhance nonlinear scattered components.

Description

[0001] 1. Technical field [0002] The present invention is directed to real-time ultrasound imaging of the heart, and visualization and analysis of images for detection of regional defects in myocardial (MC) systolic and diastolic function. [0003] 2. Background technology [0004] Material properties that determine electromagnetic (EM) or elastic (EL) wave propagation and scattering in a material typically show a variation with field strength in the wave. Such materials are said to be nonlinear and cause nonlinear wave propagation and nonlinear scattering of both EM and EL waves. Measurement or imaging of nonlinear scattering sources is useful in many situations to identify the properties of such materials. [0005] Both the forward wave propagation and the local scattering of EM or EL waves have mathematical similarities, and the methods and instruments used for imaging therefore have similar structures. Examples of the use of EL waves are material inspection with both sh...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61B5/05A61B8/14G01S7/52
CPCA61B5/05A61B8/14A61B8/485G01S7/52022G01S7/52042G01S7/52049G01S7/52077A61B8/0883A61B8/5261G01H9/008
Inventor 比约恩·A·J·安杰尔森托尔·安德烈亚斯·坦根
Owner SURF TECH AS
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