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Light-on test method and device

A test method and technology to be tested, applied in the direction of instruments, static indicators, nonlinear optics, etc., can solve problems such as the choice of signal input, the limitation of lighting screen, and the inability to select input signals for lighting test methods.

Inactive Publication Date: 2015-02-18
BOE TECH GRP CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] The embodiment of the present invention provides a lighting test method and device, which solves the problem that the existing lighting test method cannot select the input signal, so that the selection of the signal input and the lighting screen are limited, and the driver chip can be used for each pixel. Advantages of control, optimize ET lighting detection program, optimize ET detection

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Embodiment 2

[0050] The embodiment of the present invention also provides a lighting test device, refer to Figure 4 As shown, the device includes: an adapter plate 30 integrated with a driver chip 31, the driver chip 31 is used to generate a driving signal for testing; a flexible circuit board 40 is used for inputting the driving signal for testing into the product to be tested. Display signal input port 11, one end of the flexible circuit board 40 is connected to the signal output end of the driver chip 31, and the other end is connected to the display signal input port 11 of the product to be tested.

[0051] The lighting test device provided by the embodiment of the present invention can give full play to the driving advantages of the driver chip by feeding the detection signal through the driver chip, and can realize the lighting detection screen by swiping pictures, which can further optimize the lighting detection program of ET and optimize the ET Check out. Compared with the prior...

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Abstract

The invention discloses a light-on test method and device, and relates to the field of display. The method and the device solve the problem that input signals cannot be selected in the existing light-on test method, so the signal giving selection and the light-on image are limited. The advantage of controlling each pixel by a driving chip can be realized, a light-on detection program of an ET (cell test) is optimized, and the ET inspection is optimized. The light-on test method provided by the invention comprises the following steps that the driving chip is integrated onto a pinboard; then, the signal output end of the driving chip is correspondingly connected with a display signal input port of a product to be tested through a flexible circuit board; the light-on test is carried out.

Description

technical field [0001] The invention relates to the display field, in particular to a lighting test method and device. Background technique [0002] Liquid crystal displays (Liquid Crystal Displays, LCDs) have very low power consumption, and have the characteristics of high image quality, small size, and light weight, so they are favored by everyone and become the mainstream of displays. [0003] Liquid crystal display is a flat and ultra-thin display device, which consists of a certain number of color or black and white pixels. At present, liquid crystal displays are mainly thin film transistor (Thin Film Transistor, TFT) liquid crystal displays. LC Cell Assembly) preparation process, liquid crystal display module (Liquid Crystal Module, LCM) preparation process. During the manufacturing process of the liquid crystal panel, multiple inspection procedures need to be carried out. One of the most important inspection procedures is to test the cut liquid crystal cells (Cell T...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13G09G3/00
CPCG02F1/1309G09G3/006
Inventor 肖均洋杨志辉楚正勇朴世赫
Owner BOE TECH GRP CO LTD