Mobile terminal test device and mobile terminal test method

Abstract

A mobile terminal test device includes a frame structure storage unit that stores a plurality of frame structure information items indicating the allocation patterns of a downlink (DL) and an uplink (UL) to a predetermined number of sub-frames forming one TDD frame, a scenario processing unit 24 including means for designating the type of frame used for a throughput test, and a timing control unit 27 that determines at least one of UL sub-frames in the designated type of frame as a response start sub-frame for returning acknowledgement / negative-acknowledgement messages from a mobile terminal 1 with reference to the frame structure information corresponding to the designated type of frame and determines at least one of DL sub-frames that are a predetermined number of sub-frames before the response start sub-frame as a transmission start sub-frame. The DL throughput of an arbitrarily designated type of frame is accurately calculated.

Description

technical field [0001] The present invention relates to a technique for accurately measuring throughput when a TDD (Time Division Duplex) mobile terminal receives downlink (hereinafter, referred to as DL) data from a base station. Background technique [0002] There are various tests for mobile terminals such as mobile phones and smartphones, and one of the most important test items is the throughput test for measuring the throughput when receiving DL data from a base station. [0003] The test of the mobile terminal is carried out using a so-called virtual base station device that communicates with the mobile terminal in imitation of a base station. However, the throughput test is performed by sending user data to the mobile terminal in DL from the test device side. and calculate the throughput based on the number of acknowledgment / non-acknowledgment (hereinafter, described as ACK / NACK) messages that are replied from the mobile terminal on the uplink (hereinafter, described...

AI Technical Summary

Problems solved by technology

[0009] However, in the case of a TDD (Time Division Duplex Communication) method (such as TD-LTE (Time Division Long Term Evolution) method) that uses the same frequency for DL ​​and UL and performs duplex communication in a time-division method, although the configuration 1 DL and UL are allocated to a predetermined number of subframes (for example, 10) of a frame, but since the allocation pattern can be changed according to the communication environment, etc., the mobile terminal starts to respond to its user data with an ACK / NACK message The timing is not fixed relative to the start position of the user data transmission of the DL used for the throughput test, and the ACK / NACK message may not be obtained at the exact timing to measure the throughput, which may cause errors in the measurement results

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