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Display device and its test pad

A technology of display device and test pad, applied in static indicators, instruments, nonlinear optics, etc., can solve the problems of insufficient chip space, limited accommodating circuit area, limited chip space, etc.

Active Publication Date: 2018-11-13
INNOLUX CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, when the resolution of the panel increases and the signal output contacts required by the chip (such as the drive unit) increase, it means that the output lines of the chip increase, but the area that can accommodate the lines is limited, and because some lines pass under the chip, the space under the chip is also limited. Limited; therefore, when the number of output lines increases, in addition to compressing the area originally used to accommodate the lines, it also affects the problem of insufficient space for wiring to pass under the chip

Method used

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  • Display device and its test pad
  • Display device and its test pad
  • Display device and its test pad

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Embodiment Construction

[0059] The following is a detailed description of the display device and its test pad of the present invention. It should be appreciated that the following description provides many different embodiments or examples for implementing different aspects of the invention. The specific components and arrangements described below are intended to briefly describe the present invention. Of course, these are only examples rather than limitations of the present invention. Furthermore, repeated reference numerals or designations may be used in different embodiments. These repetitions are only for the purpose of simply and clearly describing the present invention, and do not represent any relationship between the different embodiments and / or structures discussed. Furthermore, when it is mentioned that a first material layer is located on or above a second material layer, it includes the situation that the first material layer is in direct contact with the second material layer. Alterna...

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Abstract

The invention discloses a display device and a test pad thereof. The display device includes: a display area; and a non-display area, adjacent to the display area, and includes: a gate drive circuit; a drive unit; and a test pad; wherein the drive unit is tested The pad is electrically connected to the gate drive circuit.

Description

technical field [0001] The present invention relates to a display device, and in particular to a display device with a test pad. Background technique [0002] With the development of digital technology, display devices have been widely used in various aspects of daily life. For example, they have been widely used in modern information equipment such as TVs, notebooks, computers, mobile phones, and smart phones. Toward light, thin, short and fashionable direction. [0003] However, when the resolution of the panel increases and the signal output contacts required by the chip (such as the drive unit) increase, it means that the output lines of the chip increase, but the area that can accommodate the lines is limited, and because some lines pass under the chip, the space under the chip is also limited. Limited; therefore, when the number of output lines increases, it will not only compress the area originally used to accommodate the lines, but also affect the problem of insuff...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13G09G3/00G09G3/36
Inventor 陈宏昆黄郁迪张鸿光
Owner INNOLUX CORP