Vacuum insulator surface charge three-dimensional measurement apparatus

A three-dimensional measurement and vacuum insulation technology, which is applied in the direction of measuring devices, measuring electrical variables, instruments, etc., can solve the problems of complex shape of insulators, complex measurement of insulator surface charge, etc., to ensure accuracy, ensure air tightness, and high charge resolution and the effect of spatial resolution

Active Publication Date: 2015-10-21
NORTH CHINA ELECTRIC POWER UNIV (BAODING)
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Problems solved by technology

[0004] To sum up, for the insulating solid surface, the commonly used measurement method is the electrostatic capacitance probe method. However, due to the complex shape of the insulators commonly used in the vacuum system, it is more complicated to measure the surface charge of the insulator with the conventional electrostatic probe. Therefore, it is necessary to The principle of electrostatic capacitance method to measure the surface charge of insulators, and develop a set of devices that can be used for actual vacuum insulator surface charge measurement

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  • Vacuum insulator surface charge three-dimensional measurement apparatus

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Embodiment Construction

[0017] The invention provides a three-dimensional measuring device for the surface charge of a vacuum insulator, which will be described below with reference to the accompanying drawings.

[0018] exist figure 1 In the schematic diagram of the three-dimensional measurement device for the surface charge of the vacuum insulator, the three-dimensional measurement device for the surface charge of the vacuum insulator is controlled by the insulator to be tested, the test electrode, the electrostatic probe, the probe bracket, the probe radial movement mechanism, the probe rotation control mechanism, and the probe bracket. Mechanism, probe rotation motion control mechanism, stepping motor and probe motion control panel; the test electrodes include the high-voltage electrode 1 on the top plate of the fixed vacuum test chamber, the ground electrode 3 fixed on the center of the probe turntable 5, and the insulator to be tested 2 Placed between the high-voltage electrode 1 and the ground...

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Abstract

The invention discloses a vacuum insulator surface charge three-dimensional measurement apparatus, belonging to the insulation measurement and charge measurement technical field under the vacuum environment. The measurement apparatus is composed of an insulator to be measured, a test electrode, a static probe, a probe support, a probe radial motion mechanism, a probe rotation control mechanism, a probe rotary motion control mechanism, a stepping motor and a probe motion control panel, wherein a high voltage electrode is fixed to the top panel of a vacuum test cavity, a ground electrode is fixed to the central section of a probe rotary table, the insulator to be measured is placed between a high voltage electrode and a ground electrode, and the probe rotary table is supported on the bottom panel of the vacuum test cavity. The invention provides the vacuum insulator surface charge three-dimensional measurement apparatus, which can realize insulator surface charge three-dimensional measurement in all radial directions and all angles through the radial control mechanism and the rotary control mechanism, meanwhile guarantee that a probe is far from the surface of the insulator to be measured in compression or not measuring charges, and possess higher charge resolution and spatial resolution.

Description

technical field [0001] The invention belongs to the technical field of insulation measurement and charge measurement in a vacuum environment, and in particular relates to a three-dimensional measurement device for the surface charge of a vacuum insulator. Background technique [0002] The measurement of the surface charge of an insulator belongs to the category of electrostatic measurement and cannot be measured with traditional electrical instruments. At present, the measurement methods of surface charge mainly include dust map method, optical measurement method based on Pockels effect and electrostatic probe method. The dust map method was first proposed by Lichtenberg in 1778. Its principle is to use some charged colored solids (such as positively charged red Pb3O4, negatively charged white yellow S), which will have an adsorption effect on the surface of the insulator. For example, negative charges will adsorb positively charged Pb3O4, and positive charges will adsorb n...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/24
Inventor 齐波孙泽来高春嘉李成榕
Owner NORTH CHINA ELECTRIC POWER UNIV (BAODING)
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