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Defect inspection system and film production apparatus

A defect inspection and photographing device technology, applied in measuring devices, using optical devices, controlling lamination, etc., to achieve the effect of suppressing false reports of defects

Active Publication Date: 2016-02-03
SUMITOMO CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] However, if flaws are generated on the surface of the second film during film conveyance, the flaws on the surface of the second film, which are not a problem originally, may be erroneously detected as defects.

Method used

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  • Defect inspection system and film production apparatus
  • Defect inspection system and film production apparatus
  • Defect inspection system and film production apparatus

Examples

Experimental program
Comparison scheme
Effect test

no. 1 approach

[0031] figure 1 It is a side view which shows the film manufacturing apparatus 1 which concerns on 1st Embodiment of this invention. exist figure 1 In , reference numeral Sf1 is the upper surface of the film F, and is the surface on the first film F1 side. Reference numeral Sf2 is the lower surface of the film F, and is a surface on the second film F2 side.

[0032] In the following description, an XYZ rectangular coordinate system is set as needed, and the positional relationship of each member is demonstrated with reference to this XYZ rectangular coordinate system. In the present embodiment, the conveying direction of the strip-shaped film is defined as the X direction, the direction (the width direction of the long film) perpendicular to the X direction in the plane of the film is defined as the Y direction, and the direction perpendicular to the X direction is defined as The direction perpendicular to the Y direction is defined as the Z direction.

[0033] Such as fi...

no. 2 approach

[0083] Next, use Figure 6 ~ Figure 9 A second embodiment of the present invention will be described.

[0084] Figure 6 It is a side view showing the film manufacturing apparatus 101 according to the second embodiment of the present invention.

[0085] Such as Figure 6 As shown, the film manufacturing apparatus 101 of this embodiment differs from the film manufacturing apparatus 1 of the first embodiment in that the first film F1a is a polarizer, and the defect inspection apparatus 105 includes a light source 20 arranged On the polarizer F1a side of the film Fa; the photographing device 22, which is arranged on the second film F2 side of the film Fa; and the polarizing filter 123, which is arranged on the optical path between the photographing device 22 and the film Fa . For other structures that are the same as those of the first embodiment, the same reference numerals are attached, and detailed description is omitted.

[0086] The film Fa is a tape-shaped film includi...

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Abstract

This defect inspection system includes: lamination rolls for laminating a first film and a second film to form a film; a transport line to the downstream side from the lamination rolls, for transporting the film; a defect inspection apparatus situated on the transport line; and a recording apparatus situated on the transport line to the downstream side from the defect inspection apparatus, for recording onto the film defect information relating to defects detected by the defect inspection apparatus. The defect inspection apparatus is located on the transport line to the upstream side from the roll that, apart from the lamination rolls, initially contacts the second film on the surface on the opposite side from the first film.

Description

technical field [0001] The present invention relates to a defect inspection system and a film manufacturing device. [0002] This application claims priority based on Japanese Patent Application No. 2013-117947 for which it applied on June 4, 2013, and uses the content here. Background technique [0003] A defect inspection system described in Patent Document 1 is known as a defect inspection system for a strip-shaped film. The defect inspection system of Patent Document 1 includes a defect inspection device and a recording device for recording defect information on a film on a transport line of the film. [0004] On the other hand, the film manufacturing apparatus described in patent document 2 is known as a film manufacturing apparatus. The film manufacturing apparatus of Patent Document 2 includes: a bonding roller that bonds a first film and a second film to form a film; a conveying line that conveys the film on the downstream side of the bonding roller; and a defect i...

Claims

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Application Information

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IPC IPC(8): G01N21/892G01B11/30
CPCG01N21/8422G01N21/896G01N2021/8438G01N2021/8848B32B27/08B32B41/00B32B2041/04G01N21/8901G01N21/8914
Inventor 井村圭太
Owner SUMITOMO CHEM CO LTD
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