A photothermal weak absorption test system and method

A test system, weak absorption technology, used in optical testing of flaws/defects, measuring devices, material analysis by optical means, etc.
CN105738372BActive Publication Date: 2019-05-03LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS

Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Patents(China)
Current Assignee / Owner
LASER FUSION RES CENT CHINA ACAD OF ENG PHYSICS
Publication Date
2019-05-03

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Abstract

The invention provides a photo-thermal weak absorption test system and method which are applied to the field of absorption defect test of optical elements. The photo-thermal weak absorption test system comprises an off-axis parabolic mirror, a sample table, a detector, a detection light source and a plurality of pump light sources, wherein the wavelengths of the pump light emitted by the pump light sources are not the same; the pump light respectively emitted by the pump light sources is focused on a preset point to be detected of a sample to be detected mounted on the sample table after being reflected by the off-axis parabolic mirror, the detection light emitted by the detection light source is also focused on the preset point to be detected of the sample to be detected, and the detection light which penetrates through the sample to be detected enters the detector, so that the sample to be detected can absorb the pump light emitted by the pump light sources. The photo-thermal weak absorption test system and method provided by the invention are capable of effectively realizing the weak absorption test on the surfaces, sub-surfaces and optical films of optical materials under the combined action of a plurality of pump lasers with different wavelengths.
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Description

technical field

[0001] The invention relates to the field of absorption defect testing of optical components, in particular to a photothermal weak absorption testing system and method. Background technique

[0002] The weak absorption of transmitted laser light by absorption defects on the surface, subsurface or film layer of optical components is currently recognized by the academic circle as the main cause of laser damage to components. Obtaining the absorption size and distribution of incident light by component absorption defects is of great significance for evaluating component processing level and damage performance. The photothermal weak absorption method can realize non-destructive detection of component absorption defects, has high detection sensitivity, and can meet the detection requirements of weak absorption defects of transparent optical components. In the practical application of optical components, many components do not work under the irradiation of single-...

Claims

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