LTE cell overlapping coverage analysis method based on MR data

A cell overlapping and overlapping coverage technology, applied in data exchange networks, digital transmission systems, electrical components, etc., can solve the problem that the interference source cell data is not easy to accurately determine, high overlapping cells and interference source cells have low accuracy and authenticity. and other problems, so as to achieve the effect of comprehensive and precise positioning of the problem collection process.

Inactive Publication Date: 2016-08-03
WUHAN HONGXIN TECH SERVICE CO LTD
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AI Technical Summary

Problems solved by technology

[0007] (3) The accuracy and authenticity of highly overlapping cells and interference source cells calculated by network optimization personnel are very low
[0008] (4) The determination of the interference source cell requires too much data and is not easy to determine accurately

Method used

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  • LTE cell overlapping coverage analysis method based on MR data
  • LTE cell overlapping coverage analysis method based on MR data
  • LTE cell overlapping coverage analysis method based on MR data

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Embodiment Construction

[0028] The present invention proposes a method for analyzing overlapping coverage of LTE cells by using MR data, inputting MR test data, and performing clustering and analysis on signals according to the information of the main serving cell and neighboring cells reported by MR, which can be based on the MR sampling points ENodeBId and CI aggregates the signals of the same cell into this cell. First of all, it automatically screens high-overlap coverage cells through the set cell overlap coverage analysis algorithm, and then optimizes high-overlap coverage cells through an original multi-factor correlation analysis algorithm. Multi-factor correlation analysis is used to analyze the optimization idea of ​​the cell with high overlapping coverage of the cell. This proposal conducts a comprehensive analysis of multiple factors associated with high overlapping coverage cells, including weight analysis of overlapping coverage adjacent cells, coverage distance analysis, weak coverage ...

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Abstract

The present invention proposes a method for analyzing overlapping coverage of LTE cells based on MR data, including collecting MR data, obtaining LTE MR data files and cell information tables; Respectively form overlapping coverage adjacent cell pairs with the main cell, and calculate the weight of overlapping adjacent cell pairs according to the signal points of overlapping adjacent cells, sort and determine the priority of overlapping coverage cells and then screen them, and analyze the coverage distance of cells that have passed the weight screening to determine High overlapping coverage cells to be optimized; multi-factor correlation analysis, including weak coverage correlation analysis, useful signal proportion analysis and user concentration correlation analysis. The technical scheme of the present invention can more accurately locate problem cells, and can put forward more reasonable optimization suggestions, and can perform all-round inspection and troubleshooting of overlapping coverage cells.

Description

technical field [0001] The invention relates to the field of mobile communication, in particular to a method for analyzing overlapping coverage of LTE cells based on MR data. Background technique [0002] The continuous development of communication technology has brought great convenience to high-speed transmission in the current data era. TD-LTE (Time Sharing Long-Term Evolution) network is a high-speed wireless communication technology with a transmission speed of over 100 Mbps. In TD-LTE networking, many In the case of same-frequency and different-frequency networking, due to limited frequency resources, it is difficult to reduce interference between cells through frequency optimization, so the risk of interference in the case of the same frequency is greatly increased. Under the premise of ensuring user mobility, an ideal cellular network can keep the cells at a lower level in the overlapping area. The degree is difficult to control and has a great impact on the network...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04W24/02H04W24/10H04L12/24
CPCH04W24/02H04L41/14H04L41/145H04W24/10
Inventor 陈峰王伟杨然胡志勇阳许军王婕郑继东叶仕祥肖伟明
Owner WUHAN HONGXIN TECH SERVICE CO LTD
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