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Binary description and matching method of image feature points based on point group comparison strategy

A technology of image feature points and binary description, applied to instruments, character and pattern recognition, computer components, etc., can solve problems such as single pixel instability

Active Publication Date: 2017-02-15
HENAN POLYTECHNIC UNIV
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Problems solved by technology

[0004] The present invention aims at the shortcomings of the existing binary matching descriptors, which are easily affected by noise and unstable when comparing the gray scale of a single pixel, and proposes a binary description and matching method of image feature points based on a point group matching strategy, which mainly includes The following steps:

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  • Binary description and matching method of image feature points based on point group comparison strategy
  • Binary description and matching method of image feature points based on point group comparison strategy

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Embodiment Construction

[0019] Such as figure 1 Shown is the image feature point binary description and matching method flow chart based on the point group comparison strategy of the present invention, which mainly includes the following steps: collecting images and performing preprocessing, using SIFT or Harris corner detection algorithm to extract the two images respectively Feature points, determine the feature point support area and calculate the main direction of the feature point, select 32 sampling points in the feature point support area, determine 144 sets of sampling point pairs in the feature point support area, and perform binarization processing based on the point group comparison strategy 1. Construct the binary feature descriptor of the feature point, and use the NNDR criterion to match the feature point based on the binary feature descriptor. The specific implementation details of each step are as follows:

[0020] Step S1: collecting images and performing preprocessing, specifically...

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Abstract

The invention provides a binary description and matching method of image feature points based on a point group comparison strategy. The method comprises steps of collecting two images and carrying out preprocessing, using a SIFT or Harris corner point detection algorithm to extract feature points from the two images separately, determining a feature point support area and calculating the main direction of feature points, selecting 32 sample points in the feature point support area, determining 144 groups of sample point pairs in the feature point support area, carrying out binary processing on the basis of a point group comparison strategy, constructing a binary feature descriptor of the feature points, and using the NNDR principle to carry out feature point matching based on the binary feature descriptor. The method has higher stability than binary description and matching methods which compare gray values of individual pixels directly.

Description

technical field [0001] The invention relates to the field of feature point matching in image processing, in particular to the construction of binary descriptors in digital images and a feature point matching method. Background technique [0002] With the proposal and application of SIFT technology (D. Lowe, Distinctive image features from scale-invariant keypoints, International Journal of Computer Vision. 2004, 60(2): 91–110) as an important symbol, the feature point matching technology is used in target recognition, target It has been widely used in many scenes such as tracking and scene stitching. In recent years, with the rapid and widespread application of mobile smart devices, the binary description and matching method of feature points with small storage space and high processing efficiency has become an important technology and research hotspot. [0003] The existing feature point binary description methods mainly include BRISK (S. Leutenegger, M. Chli, and R. Siegw...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62G06K9/46
CPCG06V10/462G06V10/44G06V10/751
Inventor 刘红敏王志衡司马海峰霍占强贾利琴姜国权王静
Owner HENAN POLYTECHNIC UNIV
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