Solid-state disk error correction method combining error detection code with error correction code

Abstract

The invention discloses a solid-state disk error correction method combining an error detection code with an error correction code. The method comprises the following steps of (1) before data is written in a solid-state disk, encoding original data of flash pages, and storing the data in a storage unit of the solid-state disk; and (2) detecting error states of the flash pages in the storage unit by using error detection code decoding operation, directly reading the flash pages without errors, and performing error correction on the flash pages with errors by using low-density parity-check code (LDPC) decoding operation. According to the method, the flash pages can be subjected to error detection by using error detection code cyclic redundancy check (CRC) firstly when the error rates of the flash pages are very low in an early use stage of the solid-state disk; the detected pages without the errors are directly read without being subjected to the LDPC decoding process; and the detected pages with the errors are subjected to LDPC decoding-based error correction.

Description

technical field [0001] The invention belongs to the technical field of solid-state disk error correction, and in particular relates to an error correction method for a solid-state disk using a combination of an error detection code and an error correction code. Background technique [0002] Solid-state disks have been applied to various fields of people's lives. It is very important to ensure the security of data stored in solid-state disks. Among them, error-correcting codes are one of the most commonly used data security technologies for solid-state disks. As the solid state disk manufacturing process advances, the size of the flash memory unit becomes smaller and smaller, and the corresponding noise also increases. The internal noise of the solid-state disk is determined by many factors, such as the number of erasing and writing, data storage time, etc. The erasing and writing operations can destroy the oxide layer around the flash memory unit, and cause charge coupling e...

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Problems solved by technology

[0005] (1) This method does not consider the processing of error-free pages, and error-free pages do not need to be decoded and can be read directly;

[0006] (2) This method needs to judge the error interval of the data, and for the early use stage of the solid state disk, the error rate is

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