Laser particle analyzer and method for testing particle size distribution

A laser particle size analyzer and particle size distribution technology, which is applied in particle size analysis, particle and sedimentation analysis, instruments, etc., can solve problems such as occupying computer computing memory, complicated operation, and reduced computing speed.

Inactive Publication Date: 2017-05-10
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

The silicon photodiode detector can directly process the photoelectric signal received by the ring detection unit in the later stage. The disadvantage is that it directly uses photoelec

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  • Laser particle analyzer and method for testing particle size distribution
  • Laser particle analyzer and method for testing particle size distribution
  • Laser particle analyzer and method for testing particle size distribution

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Embodiment Construction

[0031] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0032] Please refer to figure 1 and figure 2 , figure 1 Schematic diagram of the laser particle size analyzer provided by the embodiment of the present invention; figure 2 A schematic diagram of a charge-coupled photodetector provided with a circular mask on the surface provided by an embodiment of the present invention.

[0033] In a s...

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Abstract

The invention discloses a laser particle analyzer which comprises a laser light source for transmitting a laser beam, a sample pool for accommodating a to-be-tested sample, a charge coupling photoelectric detector and a calculator, wherein the charge coupling photoelectric detector is used for receiving scattered light generated after the laser beam penetrates the to-be-tested sample and converting the scattered light into a scattered light energy distribution diagram, and the surface of the charge coupling photoelectric detector is provided with a ring mask plate; and the calculator is used for calculating grain size distribution of the to-be-tested sample according to the scattered light energy distribution diagram. The goal of using the ring mask plate is to obtain corresponding positions of each pixel receiving the scattered light more visually, conveniently extract energy of the scattered light according to the position corresponding to each pixel, quickly draw the scattered light energy distribution diagram, and accelerate the speed of calculating the grain size distribution of the to-be-tested sample. The invention further provides a method for testing the grain size distribution, and the method has aforementioned effects.

Description

technical field [0001] The invention relates to the technical field of instruments and meters, in particular to a laser particle size analyzer, and also to a particle size distribution testing method. Background technique [0002] The laser particle size analyzer is an instrument for testing the particle size distribution and particle size based on the particle's ability to diffract or scatter laser light to obtain a scattering spectrum. Its specific working principle is as follows: Since the laser has good monochromaticity and strong directionality, a beam of parallel laser light will irradiate to an infinite distance in an infinite space without hindrance, and it will be very fast during the propagation process. There is little divergence; when the beam is blocked by particles, part of the light will be scattered, and the propagation direction of the scattered light will form an angle θ with the propagation direction of the main beam. Scattering theory and experimental re...

Claims

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Application Information

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IPC IPC(8): G01N15/02
CPCG01N15/0211
Inventor 党博石刘英姜洋杜杰邢妍王天骄
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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