The invention discloses a
granularity centering measuring method utilizing a CCD (
charge coupled device) or
CMOS (complementary
metal-
oxide-
semiconductor) as a photoelectric
detector. The method comprises the following steps: 1, adopting a CCD or
CMOS as a multielement photoelectric
detector, utilizing a power adjustable
laser, and lowering the power of the
laser before
granularity of granules ismeasured, thus a low power
laser beam is not saturated when being focused on the CCD or
CMOS; and recording the pixel position of the laser spot on the CCD or CMOS, and taking the measured pixel of the spot as a scattering center position during
granularity measurement; 2, adjusting the power of the laser to the limit power at which the pixel with a peak
signal is not saturated, carrying out measurement, and recording the distribution of lights scattered by the granules; and 3, calculating according to the
light scattering theory to obtain granularity distribution of the granules on the basisof the initially determined scattering center position. According to the invention, the defects that the traditional laser granularity instrument is complex in centering and the pixel is easily saturated or damaged when the CCD or CMOS is adopted as the photoelectric
detector are solved, a hardware centering device is omitted, no concentric adjusting is required, and the granularity measurement of the granules can be realized.